PROJECTION OBJECTIVE FOR MICROLITHOGRAPHY, PROJECTION EXPOSURE APPARATUS, PROJECTION EXPOSURE METHOD AND OPTICAL CORRECTION PLATE
    1.
    发明公开
    PROJECTION OBJECTIVE FOR MICROLITHOGRAPHY, PROJECTION EXPOSURE APPARATUS, PROJECTION EXPOSURE METHOD AND OPTICAL CORRECTION PLATE 审中-公开
    投影镜头微光刻,投影曝光装置,投影曝光方法和光学校正板

    公开(公告)号:EP2188673A1

    公开(公告)日:2010-05-26

    申请号:EP08784878.4

    申请日:2008-07-18

    申请人: Carl Zeiss SMT AG

    IPC分类号: G03F7/20 G03F1/14

    摘要: A projection objective comprising a plurality of optical elements arranged to image a pattern from an object field in an object surface of the projection objective to an image field in an image surface of the projection objective with electromagnetic operating radiation from a wavelength band around an operating wavelength λ includes an optical correction plate. The optical correction plate has a body made from a material transparent to the operating radiation, the body having a first optical surface, a second optical surface, a plate normal substantially perpendicular to the first and second optical surface, and a thickness profile. The first surface profile and the second surface profile are similar in that the first optical surface has a non-rotationally symmetric aspheric first surface profile with a first peak-to-valley value PV1>λ; the second optical surface has a non-rotationally symmetric aspheric second surface profile with a second peak-to-valley value PV2>λ; and the plate thickness varies by less than 0.1 * (PV1+PV2V2 across the optica! correction piate. The first and second optical surface in combination may induce or correct for a dominant field aberration if the optical correction plate is installed at a position far from the object plane of the projection objective.