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公开(公告)号:EP4339992A1
公开(公告)日:2024-03-20
申请号:EP23196850.4
申请日:2023-09-12
申请人: Carl Zeiss SMT GmbH
摘要: The present application relates to a method for characterizing a shielding element (C) of a particle beam device (100) for shielding an electric field between a sample position and a particle beam source (101). The method comprises positioning a means for characterizing (S1, S2, S3) the shielding element on a side of the shielding element which is facing the sample position.