MESH INTEGRITY CHECK
    1.
    发明公开

    公开(公告)号:EP4339992A1

    公开(公告)日:2024-03-20

    申请号:EP23196850.4

    申请日:2023-09-12

    IPC分类号: H01J37/02 H01J37/09

    摘要: The present application relates to a method for characterizing a shielding element (C) of a particle beam device (100) for shielding an electric field between a sample position and a particle beam source (101). The method comprises positioning a means for characterizing (S1, S2, S3) the shielding element on a side of the shielding element which is facing the sample position.