利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

2 条记录 (耗时 0.01 秒)

    Method and system for tracking scattering parameter test system calibration
    2.
    发明公开
    Method and system for tracking scattering parameter test system calibration 有权
    Verfahren und System zur Verfolgung der Streuparameter-Prüfsystemkalibrierung

    公开(公告)号：EP2081031A1

    公开(公告)日：2009-07-22

    申请号：EP09150811.9

    申请日：2009-01-16

    申请人： Com Dev International Limited

    发明人： Albert-Lebrun, Xavier M. H. ,  Lisi, Mario ,  Van Lingen, Charles ,  Peach, Robert Christopher

    IPC分类号： G01R27/28 ,  G01R35/00

    CPC分类号： G01R35/005 ,  G01R27/32

    摘要： Embodiments describe methods of correcting S-parameter measurements for a DUT. The method includes coupling at least one tracking module associated with a set of electrical standards to a S-parameter measurement device to form a test system. An initial calibration for the test system is then determined. This may include measuring the S-parameters of the electrical standards, generating a calibration along a calibration plane, generating a calibration along a correction plane and determining at least one error adapter from the calibrations. The DUT is coupled to the test system and the S-parameters of the DUT are measured. Changes in the initial calibration are tracked using the tracking modules. Tracking may include measuring the S-parameters of the electrical standards, generating a correction plane calibration and generating a corrected calibration plane calibration from the correction plane calibration and the error adapter(s). The measured S-parameters are corrected using the tracked changes.

    摘要翻译： 实施例描述了校正DUT的S参数测量的方法。 该方法包括将与一组电气标准相关联的至少一个跟踪模块耦合到S参数测量装置以形成测试系统。 然后确定测试系统的初始校准。 这可以包括测量电气标准的S参数，沿着校准平面产生校准，沿校正平面生成校准，并根据校准确定至少一个错误适配器。 DUT耦合到测试系统，并测量DUT的S参数。 使用跟踪模块跟踪初始校准的变化。 跟踪可以包括测量电气标准的S参数，产生校正平面校准并从校正平面校准和错误适配器生成校正的校准面校准。 测量的S参数使用跟踪的变化进行校正。