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公开(公告)号：EP2537270B1
公开(公告)日：2020-08-26
申请号：EP11703564.2
申请日：2011-02-08
IPC分类号： H04B17/21 , H04B17/23 , H04B17/345 , H04B17/40
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公开(公告)号：EP3745614A2
公开(公告)日：2020-12-02
申请号：EP20185976.6
申请日：2011-02-08
IPC分类号： H04B17/21 , H04B17/23 , H04B17/40 , H04B17/345
摘要： A signal repeating device for repeating signals in a wireless communication system, the signal repeating device comprising: signal path elements for defining at least an uplink signal path or a downlink signal path in the signal repeating device, the signal path elements including: frequency conversion circuitry; filter circuitry; amplifier circuitry; circuitry configured for obtaining an operational noise measurement in a signal path of the signal repeating device and for measuring an operational noise level in a frequency band that is outside of and adjacent to a bandwidth of a first element located in the signal path; circuitry configured for retrieving a stored parameter that includes a previously determined reference noise level for the signal repeating device; and circuitry configured for comparing the measured operational noise level to the retrieved reference noise level parameter and using the comparison to evaluate the gain of at least a section of the signal repeating device to determine a failure or malfunction of an element in the signal repeating device.
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公开(公告)号：EP3745614A3
公开(公告)日：2021-02-24
申请号：EP20185976.6
申请日：2011-02-08
IPC分类号： H04B17/21 , H04B17/23 , H04B17/40 , H04B17/345
摘要： A signal repeating device for repeating signals in a wireless communication system, the signal repeating device comprising: signal path elements for defining at least an uplink signal path or a downlink signal path in the signal repeating device, the signal path elements including: frequency conversion circuitry; filter circuitry; amplifier circuitry; circuitry configured for obtaining an operational noise measurement in a signal path of the signal repeating device and for measuring an operational noise level in a frequency band that is outside of and adjacent to a bandwidth of a first element located in the signal path; circuitry configured for retrieving a stored parameter that includes a previously determined reference noise level for the signal repeating device; and circuitry configured for comparing the measured operational noise level to the retrieved reference noise level parameter and using the comparison to evaluate the gain of at least a section of the signal repeating device to determine a failure or malfunction of an element in the signal repeating device.
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