摘要:
A method for introducing samples through a boundary member partially defining a chamber at an entrance point coaxial to a sampling inlet of a mass spectrometer is described. Field-free conditions can be established in at least one region of the chamber. The sample can be introduced adjacent to the sampling inlet, and introducing at least a second sample can be introduced through at least one other entrance point in the chamber not adjacent to the sampling inlet. An apparatus having a sampling inlet and a boundary member partially defining a chamber is also described. Field-free conditions can be established in at least one region of the chamber, and there can be a first aperture in the boundary member through which a source emits sample. Related devices, uses and mass spectrometers are also described.
摘要:
A sample analysis system having a continuous beam ion mobility filter incorporates an ion removal mechanism for removing residual ions from the ion mobility filter to reduce cross-talk. A sample to be analyzed by the sample analysis system can be entered into the continuous beam ion mobility filter, which filters the ions of the sample and passes the filtered group of ions to a detector or a mass analyzer (e.g., via an ion optics assembly disposed between the mass analyzer and the ion mobility filter), where some or all of the ions in the group are detected. The ion removal mechanism then removes all or a substantial portion of the residual ions from the ion mobility filter that are left over from the first filtered group before a second filtered group is passed through. In some aspects, the ion removal mechanism can be operated concurrent with an ion removal mechanism for removing residual ions from an ion optics assembly.