公开(公告)号：EP0687243A4

公开(公告)日：1996-03-27

申请号：EP94910642

申请日：1994-03-02

申请人： DRAPER LAB CHARLES S

发明人： BELLIO STEPHEN L ,  BERNARDON EDWARD ,  CONDON MARK J ,  FLORY ROBERT S ,  FYLER DONALD C ,  HANSBERRY MITCHELL L ,  LEE TOMMY W ,  MUELLER JAMES F

IPC分类号： D06H7/00 ,  A41H3/00 ,  A41H43/02 ,  B26D7/18 ,  B65H3/22 ,  B65H5/08 ,  B65H29/24 ,  B65H29/38 ,  B65H29/60 ,  B65H45/103 ,  B65H45/28

CPC分类号： B26D7/1836 ,  B65H5/08 ,  Y10S83/937 ,  Y10S83/939 ,  Y10T83/2183 ,  Y10T83/2185 ,  Y10T83/902

摘要： A method and apparatus nondestructively remove a cut segment of predetermined shape from a limp material sheet workpiece and transport the cut workpiece segment to a staging area for further processing. Such removal and transporting is accomplished without distorting the shape of the cut segment. An apparatus (10) includes a cutting table (12), a dispensing and cutting gantry (14), a picker gantry (16), and a sheet material dispenser assembly (18), all under the control of a controller (20). Picker gantry (16) includes a cover segment picking mechanism (16A) that removes a cover sheet segment off a workpiece material sheet. The picker gantry further includes a workpiece segment picking mechanism (16B) for removing a workpiece segment from the workpiece material sheet.

公开(公告)号：EP1216397A4

公开(公告)日：2003-02-05

申请号：EP00972397

申请日：2000-09-07

申请人： DRAPER LAB CHARLES S

发明人： WEINBERG MARC S ,  BERNSTEIN JONATHAN J ,  KIRKOS GREGORY A ,  LEE TOMMY W ,  PETROVICH ANTHONY

IPC分类号： G01C19/56 ,  H01L29/84 ,  G01C19/00

CPC分类号： G01C19/5719

摘要： A micromechanical tuning fork gyroscope comprises an input axis (38) which is out-of-plane of the structure, parallel capacitor strips (42, 43) beneath a pair of apertured, planar proof masses (10) suspended from a substrate (22) by a support structure (16), wherein the proof masses are set in opposed vibrational motion by an electrostatic comb drive (12, 14), whereby in response to an input angular rate, the proof masses (10) translate with respect to the striped capacitors (42, 43), thereby varying the capacitance between the strips and the proof masses as a function of the input rate.