CRITICAL POINTS FOR TEST DATA PREPROCESSING
    1.
    发明公开

    公开(公告)号:EP4216169A1

    公开(公告)日:2023-07-26

    申请号:EP23152775.5

    申请日:2023-01-20

    IPC分类号: G06T17/20

    摘要: A computer-implemented method includes receiving, in computer memory, a first test data set that comprises results of a real-world test of a material, where the first test data set comprises a plurality of test data points. The method further includes identifying one or more critical points among the test data points in the first test data set and processing the first test data set with a computer processor to produce a second test data set with differing (e.g., fewer) test data points than the first test data set, wherein the second test data set includes all the test data points that were identified as critical points in the first test data set and at least some other data points.