Three-dimensional measurement apparatus
    1.
    发明公开
    Three-dimensional measurement apparatus 有权
    Messungen Apparatfürdreidimensionale

    公开(公告)号:EP1524492A1

    公开(公告)日:2005-04-20

    申请号:EP04256285.0

    申请日:2004-10-12

    申请人: FANUC LTD

    IPC分类号: G01B11/25

    CPC分类号: G01B11/25 G06T7/521

    摘要: A three-dimensional measurement apparatus of a slit light (or pseudo slit light) projection type that is adapted to prevent deterioration of measurement accuracy and to be easily miniaturized. When there is a disturbance in a region A in a distribution of pixels whose detected luminances exceed a threshold, a detected position C3 determined from a weighted average of luminances of pixels selected under a threshold condition along a scanning line traversing a linearly extending bright portion image 4 and liable to be deviated from a correct detected position line B-B is excluded from data to be used for the three-dimensional measurement, whereas detected positions C1, C2 are adopted that are determined so as to correspond,to scanning lines on each of which pixels whose number falls within an allowable range are detected. The allowable range varies from Nav x αmin to Nav x αmax or from Nav - β to Nav + γ, where Nav is an average of the numbers of pixels detected on scanning lines for each of which at least one pixel is determined, and αmin, αmax, β, and γ are minimum proper ratio, maximum proper ratio, subtract number of pixels, and add number of pixels, respectively, which are set in advance as parameters.

    摘要翻译: 狭缝光(或伪狭缝光)投射型的三维测量装置,其适于防止测量精度的劣化并且容易地小型化。 当检测到的亮度超过阈值的像素分布中的区域A中存在干扰时,根据沿着穿过线性延伸的亮部图像的扫描线在阈值条件下选择的像素的亮度的加权平均值确定的检测位置C3 4并且容易偏离正确的检测位置线BB被排除在用于三维测量的数据之外,而采用被确定为对应于每个扫描线上的扫描线的检测位置C1,C2 检测其数量在容许范围内的像素。 允许的范围从Nav x alpha min到Nav x alpha max或Nav-beta到Nav + gamma,其中Nav是扫描线上检测到的像素数量的平均值,每个像素的像素数至少确定一个像素, αmin,αmax,β和gamma分别是作为参数预先设置的最小适当比率,最大适当比例,减去像素数量和相加像素数。