公开(公告)号：EP2321884A4

公开(公告)日：2018-01-10

申请号：EP09807320

申请日：2009-08-13

申请人： FINISAR CORP ,  SUDO TSURUGI

发明人： SUDO TSURUGI ,  HERRICK ROBERT W ,  ROXLO CHARLES B ,  SJOLUND T H OLA

IPC分类号： H01S5/00 ,  H01S3/0941

CPC分类号： H01S5/0021 ,  G01R31/2849 ,  G02B6/4246 ,  H01S5/02248 ,  H01S5/22

摘要： Semiconductor lasers are aged to identify weak or flawed devices, resulting in improved reliability of the remaining devices. The lasers can be aged using a high-power optical burn-in that includes providing a high drive current to the lasers for a period of time, and maintaining the ambient temperature of the lasers at a low temperature. After the high-power optical burn-in, the output of the lasers can be measured to determine if the lasers are operating within specifications. Those that are not can be discarded, while those that are can be further aged using a high-temperature thermal burn-in that includes providing a drive current to the lasers while maintaining the ambient temperature of the lasers at a high-temperature.