专利检索 ap:("FormFactor, Inc.") AND inv:"KHANDROS, Igor K." 第 1 页

1.

发明公开
PROBE STRUCTURES WITH ELECTRONIC COMPONENTS 审中-公开
标题翻译：电子元件探针结构

公开(公告)号：EP2013632A2

公开(公告)日：2009-01-14

申请号：EP07755797.3

申请日：2007-04-19

申请人： FormFactor, Inc.

发明人： KHANDROS, Igor K. , GRITTERS, John K.

IPC分类号： G01R31/02

CPC分类号： G01R31/312 , G01R1/06727 , G01R1/06744 , G01R1/07342 , G01R3/00

摘要： A probe apparatus can include a substrate, a contact structure attached to the substrate, and an electronic component electrically connected to the contact structure. The electronic component can be attached to the contact structure.