公开(公告)号：EP1733223A1

公开(公告)日：2006-12-20

申请号：EP05737888.7

申请日：2005-04-05

申请人： Fraunhofer-Gesellschaft Zur Förderung der angewand ten Forschung e.v. ,  Technische Universität Dresden

发明人： HENTSCHEL, Dieter ,  TSCHÖPE, Constanze ,  HOFFMANN, Rüdiger ,  EICHNER, Matthias ,  WOLFF, Matthias

IPC分类号： G01N29/04 ,  G01N29/14 ,  G07C3/14 ,  G05B17/00 ,  G01M7/08

CPC分类号： G01N29/449 ,  G01N29/045 ,  G01N29/14 ,  G01N29/30 ,  G01N29/4445 ,  G01N29/4472

摘要： The invention relates to a method and a device for assessing the quality class of an object that is to be tested, wherein the device (100) for assessing the quality class of a an object to be tested comprises a device for detecting a test signal (108) coming from the object (104) to be tested. The device (100) for assessing also includes a device (110) for providing a stochastic Markov model, which comprises states and transitions between states based on reference measurements of objects of known quality classes, in addition to a device (114) for evaluating the test signal (108) using the stochastic Markov model. The device (110) for assessing further comprises a device (118) for classifying the object (104) to be tested in a quality class (GK) based on the evaluation of the test signal. The advantage of said device (110) is that the object (104) to be tested can be classified in a quality class (GK) in a more exact manner in comparison with prior art.