公开(公告)号：EP3427074B1

公开(公告)日：2020-02-05

申请号：EP17717186.5

申请日：2017-04-13

申请人： Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.

发明人： GERTH, Stephan ,  EINWICH, Karsten ,  MARKWIRTH, Thomas

IPC分类号： G01R31/3183 ,  G06F17/50

公开(公告)号：EP3427074A1

公开(公告)日：2019-01-16

申请号：EP17717186.5

申请日：2017-04-13

申请人： Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.

发明人： GERTH, Stephan ,  EINWICH, Karsten ,  MARKWIRTH, Thomas

IPC分类号： G01R31/3183 ,  G06F17/50

CPC分类号： G06F17/5036 ,  G01R31/318357 ,  G06F17/5022 ,  G06F17/5045 ,  G06F17/505 ,  G06F2217/02

摘要： The invention refers to an apparatus (1) for testing a circuit (2), comprising: an interrupter (12) configured for interrupting based on a circuit model (11) describing at least a part of the circuit (2) a connection (22) between two components (20, 21) of the circuit (2), wherein the circuit model (11) describes the two components (20, 21) connected by the connection (22), an inserter (13) configured for inserting based on the circuit model (11) a test element model (14) into the interrupted connection (22), and an evaluator (15) configured for evaluating based on the circuit model (11) and the test element model (14) a response of the circuit model (11) to the inserted test element model (14). The invention also refers to a corresponding method.

公开(公告)号：EP3232213A1

公开(公告)日：2017-10-18

申请号：EP16183057.5

申请日：2016-08-05

申请人： Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.

发明人： GERTH, Stephan ,  EINWICH, Karsten ,  MARKWIRTH, Thomas

IPC分类号： G01R31/3183 ,  G06F17/50

CPC分类号： G01R31/318357 ,  G06F17/5022 ,  G06F17/5036 ,  G06F17/5045

摘要： The invention refers to an apparatus (1) for testing a circuit (2), comprising: an interrupter (12) configured for interrupting based on a circuit model (11) describing at least a part of the circuit (2) a connection (22) between two components (20, 21) of the circuit (2), wherein the circuit model (11) describes the two components (20, 21) connected by the connection (22), an inserter (13) configured for inserting based on the circuit model (11) a test element model (14) into the interrupted connection (22), and an evaluator (15) configured for evaluating based on the circuit model (11) and the test element model (14) a response of the circuit model (11) to the inserted test element model (14). The invention also refers to a corresponding method.

摘要翻译： 本发明涉及一种用于测试电路（2）的装置（1），包括：中断器（12），其被配置用于基于描述电路（2）的至少一部分的电路模型（11）来中断连接（22 ），其中电路模型（11）描述由连接（22）连接的两个部件（20,21），插入器（13），其被配置用于基于 所述电路模型（11）将测试元件模型（14）插入到所述中断的连接（22）中，以及评估器（15），其被配置用于基于所述电路模型（11）和所述测试元件模型（14） 将电路模型（11）连接到插入的测试元件模型（14）。 本发明还涉及相应的方法。