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1.发明公开Methods and apparatus for troubleshooting scaleable multislice imaging system 审中-公开对于故障排除scalierbareren多层成像系统的方法和装置
公开(公告)号：EP0982659A3
公开(公告)日：2005-09-21
申请号：EP99306580.4
申请日：1999-08-20
摘要： The present invention, in one form, is an imaging system (10) which, in one embodiment, alters the configuration of a detector array (18) and a data acquisition system (32) to determine degraded component performance and generate fault isolation information. More specifically, by altering the configuration to include different combinations of detector array cells, interconnections, and one or more data acquisition channels, fault isolation information is generated.
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2.发明公开Methods and apparatus for troubleshooting scaleable multislice imaging system 审中-公开对于故障排除scalierbareren多层成像系统的方法和装置
公开(公告)号：EP0982659A2
公开(公告)日：2000-03-01
申请号：EP99306580.4
申请日：1999-08-20
IPC分类号： G06F11/22
摘要： The present invention, in one form, is an imaging system (10) which, in one embodiment, alters the configuration of a detector array (18) and a data acquisition system (32) to determine degraded component performance and generate fault isolation information. More specifically, by altering the configuration to include different combinations of detector array cells, interconnections, and one or more data acquisition channels, fault isolation information is generated.
摘要翻译： 本发明中，在一种形式中，是成像系统（10），其在一个实施方式中，年龄的检测器阵列（18）和一个数据采集系统（32），以确定矿的结构劣化成分的性能和产生故障隔离信息。 更具体地，通过改变配置，以包括检测器阵列单元，互连和一个或多个数据采集通道，则产生故障隔离信息的不同组合。
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