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    WAVE PLATE AND DIVIDED PRISM MEMBER
    2.
    发明公开
    WAVE PLATE AND DIVIDED PRISM MEMBER 审中-公开

    公开(公告)号：EP3570082A1

    公开(公告)日：2019-11-20

    申请号：EP19185566.7

    申请日：2014-05-20

    Applicant: Hamamatsu Photonics K.K.

    Inventor： KAWADA, Yoichi ,  YASUDA, Takashi ,  NAKANISHI, Atsushi

    IPC: G02B5/30 ,  G02B5/04 ,  H01Q15/06 ,  G01N21/3581

    Abstract: A divided prism member 12 constituting a prism member 2 having an entrance surface 3 for receiving a terahertz wave T, and an exit surface 4 for emitting the terahertz wave T from the entrance surface, comprising:
    a waveguide region having a partial entrance surface 13 for receiving a part of the terahertz wave T, a plurality of total reflection surfaces for totally reflecting the terahertz wave entered from the partial entrance surface 13, and a partial exit surface 14 for emitting the terahertz wave T totally reflected on the total reflection surfaces 15;
    wherein the plurality of total reflection surfaces comprises a first total reflection surface, 15a a second total reflection surface 15b, a third total reflection surface 15c and a fourth total reflection surface 15d.

    PRISM MEMBER, TERAHERTZ-WAVE SPECTROSCOPIC MEASUREMENT DEVICE, AND TERAHERTZ-WAVE SPECTROSCOPIC MEASUREMENT METHOD
    5.
    发明公开
    PRISM MEMBER, TERAHERTZ-WAVE SPECTROSCOPIC MEASUREMENT DEVICE, AND TERAHERTZ-WAVE SPECTROSCOPIC MEASUREMENT METHOD 有权
    SPEKTROSKOPISCHES TERAHERTZWELLENMESSVERFAHREN

    公开(公告)号：EP2857827A1

    公开(公告)日：2015-04-08

    申请号：EP13796936.6

    申请日：2013-05-02

    Applicant: Hamamatsu Photonics K.K.

    Inventor： AKIYAMA, Kouichiro ,  YASUDA, Takashi ,  KAWADA, Yoichi ,  NAKANISHI, Atsushi

    IPC: G01N21/35

    CPC classification number: G01N21/3586 ,  G01N21/3581

    Abstract: A prism member having an entrance surface for arranging a terahertz-wave generator for generating a terahertz wave in response to pump light incident thereon, an arrangement part for arranging an object to be measured, an exit surface for arranging a terahertz-wave detector for detecting a correlation between the terahertz wave transmitted through the object in the arrangement part and probe light, a first optical surface for collimating or condensing the terahertz wave incident thereon from the entrance surface toward the arrangement part, and a second optical surface for condensing the terahertz wave transmitted through the arrangement part toward the exit surface, the arrangement part forms a depression adapted to be filled with a liquid incapable of dissolving the object therein.

    Abstract translation: 一种具有入射表面的棱镜构件，用于响应于入射到其上的泵浦光而产生太赫兹波的太赫兹波发生器，用于布置待测物体的布置部分，用于布置用于检测的太赫兹波检测器的出射表面 通过配置部中的物体传输的太赫兹波与探测光之间的相关性，将从入射面入射到其上的太赫波的准直或聚光的第一光学面朝向配置部，以及用于冷凝太赫兹波的第二光学面 通过排列部分向出射表面透射，所述排列部分形成适于填充有不能将物体溶解在其中的液体的凹陷。

    TERAHERTZ WAVE TEMPORAL WAVEFORM ACQUISITION APPARATUS
    6.
    发明公开
    TERAHERTZ WAVE TEMPORAL WAVEFORM ACQUISITION APPARATUS 审中-公开
    VORRICHTUNG ZUR AUFNAHMETEMPORÄRERWELLENFORMEN VON TERAHERTZ-WELLEN

    公开(公告)号：EP3043167A1

    公开(公告)日：2016-07-13

    申请号：EP15202492.3

    申请日：2015-12-23

    Applicant: HAMAMATSU PHOTONICS K.K.

    Inventor： NAKANISHI, Atsushi ,  HORITA, Kazuki ,  YASUDA, Takashi

    IPC: G01N21/3586

    Abstract: A terahertz wave temporal waveform acquisition apparatus (1) includes a light source (10), a branch pant (20), a terahertz wave generation element (31), a terahertz wave detection element (32), a delay providing medium (40), a temperature adjustment unit (50), and an analysis unit (60). The delay providing medium is disposed on an optical path of a terahertz wave (L T ) from the terahertz wave generation element to the terahertz wave detection element, is formed of a material of which a refractive index for the terahertz wave depends on the temperature, and provides a delay according to the temperature to the terahertz wave. Accordingly, the terahertz wave temporal waveform acquisition apparatus which is capable of easily being miniaturized is realized.

    Abstract translation: 太赫兹波时间波形获取装置（1）包括光源（10），分支短路（20），太赫兹波发生元件（31），太赫兹波检测元件（32），延迟提供介质（40） ，温度调节单元（50）和分析单元（60）。 延迟提供介质设置在从太赫兹波发生元件到太赫兹波检测元件的太赫兹波（LT）的光路上，由用于太赫兹波的折射率取决于温度的材料形成，以及 根据太赫兹波的温度提供延迟。 因此，实现了能够容易地小型化的太赫兹波时间波形获取装置。

    ELECTRIC FIELD VECTOR DETECTION METHOD AND ELECTRIC FIELD VECTOR DETECTION DEVICE
    7.
    发明公开
    ELECTRIC FIELD VECTOR DETECTION METHOD AND ELECTRIC FIELD VECTOR DETECTION DEVICE 审中-公开
    ELEKTRISCHES FELDVEKTORDETEKTIONS EXFAHREN UND ELEKTRISCHE FELDVEKTORDETEKTIONSVORRICHTUNG

    公开(公告)号：EP3026408A1

    公开(公告)日：2016-06-01

    申请号：EP15196379.0

    申请日：2015-11-25

    Applicant: HAMAMATSU PHOTONICS K.K.

    Inventor： KAWADA, Yoichi ,  YASUDA, Takashi ,  TAKAHASHI, Hironori

    IPC: G01J3/433 ,  G01N21/3581

    CPC classification number: G01J1/44 ,  G01J1/0429 ,  G01J1/4228 ,  G01J3/0224 ,  G01J3/0262 ,  G01J3/42 ,  G01J3/433 ,  G01J3/4338 ,  G01J4/04 ,  G01J2001/4242 ,  G01N21/3581 ,  G01R15/241 ,  G01R29/0871

    Abstract: In this electric field vector detection method, an electro-optic crystal (3), where a (111) surface (3a)of an optical isotropic medium is cut out, is used as a terahertz wave detection element (3). The method includes: causing polarization of probe light (La) of ultrashort pulsed light to be circular polarization (2); allowing the probe light (La) having circular polarization to enter the terahertz wave detection element (3) and probing the terahertz wave (T); modulating the probe light, having probed the terahertz wave, by a rotating analyzer (9) and detecting the modulated probe light by a photodetector (4, 4A); performing lock-in detection of a detection signal from the photodetector by a lock-in detector using a frequency based on a rotational frequency of the rotating analyzer (9) as a reference signal; and detecting an electric field vector of the terahertz wave (T) based on a detection signal from the lock-in detector.

    Abstract translation: 在该电场矢量检测方法中，使用光学各向同性介质的（111）面（3a）的电光晶体（3）作为太赫兹波检测元件（3）。 该方法包括：使超短脉冲光的探测光（La）的极化为圆极化（2）; 允许具有圆极化的探测光（La）进入太赫兹波检测元件（3）并探测太赫兹波（T）; 通过旋转分析器（9）调制探测太赫兹波的探测光并通过光电检测器（4A，4A）检测调制的探测光; 通过锁定检测器使用基于旋转分析仪（9）的旋转频率的频率作为参考信号来执行来自光电检测器的检测信号的锁定检测; 以及基于来自锁定检测器的检测信号来检测太赫兹波（T）的电场矢量。

    ADSORPTION EVALUATION APPARATUS AND ADSORPTION EVALUATION METHOD
    8.
    发明公开
    ADSORPTION EVALUATION APPARATUS AND ADSORPTION EVALUATION METHOD 审中-公开

    公开(公告)号：EP4443136A1

    公开(公告)日：2024-10-09

    申请号：EP24165470.6

    申请日：2024-03-22

    Applicant: Hamamatsu Photonics K.K.

    Inventor： YASUDA, Takashi ,  MATSUMOTO, Satoshi

    IPC: G01N21/3581 ,  G01N21/552 ,  G01N21/3586 ,  G01N21/43

    CPC classification number: G01N21/552 ,  G01N21/3581 ,  G01N21/3586 ,  G01N21/43

    Abstract: An adsorption evaluation apparatus 1 includes a measurement unit 10 and an evaluation unit 20. The measurement unit 10 irradiates a porous framework being an evaluation object with a terahertz wave, and performs measurement of a refractive index or a real part of a complex permittivity of the porous framework based on the terahertz wave which interacted with the porous framework. The evaluation unit 20 performs evaluation of adsorption of a substance on the porous framework based on the refractive index or the real part of the complex permittivity of the porous framework measured by the measurement unit 10. Thus, an apparatus and a method capable of more accurately evaluating an adsorption phenomenon of a substance on a porous framework are realized.

    SPECTROSCOPIC MEASUREMENT DEVICE
    9.
    发明公开
    SPECTROSCOPIC MEASUREMENT DEVICE 审中-公开

    公开(公告)号：EP4105619A1

    公开(公告)日：2022-12-21

    申请号：EP22178739.3

    申请日：2022-06-13

    Applicant: Hamamatsu Photonics K.K.

    Inventor： KUGA, Takayoshi ,  KAWADA, Yoichi ,  YASUDA, Takashi ,  TOMARI, Kazutaka ,  FUJIMOTO, Masatoshi

    IPC: G01J3/02 ,  G01J3/42 ,  G01N21/3586 ,  G01N21/552

    Abstract: A spectroscopic measurement device 1 includes: a light source unit 11 for outputting pump light La and probe light Lb; a terahertz wave generation unit 21 for generating a terahertz wave T by the input of the pump light La; a terahertz wave detection unit 23 to which the terahertz wave T and the probe light Lb are input and which modulates the probe light Lb based on a refractive index that changes due to an electro-optical effect according to the input of the terahertz wave T; and a light detection unit 13 for detecting the probe light Lb modulated by the terahertz wave detection unit 23. A main body unit 2 is configured to include the light source unit 11 and the light detection unit 13. A measurement unit 3 is configured to include the terahertz wave generation unit 21 and the terahertz wave detection unit 23. The main body unit 2 and the measurement unit 3 are optically connected to each other by a polarization maintaining fiber F.

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