ABNORMALITY DETECTION DEVICE, ABNORMALITY DETECTION METHOD, AND ABNORMALITY DETECTION SYSTEM

    公开(公告)号:EP4220545A1

    公开(公告)日:2023-08-02

    申请号:EP20955233.0

    申请日:2020-09-25

    发明人: HASEGAWA, Keigo

    IPC分类号: G06T7/00

    摘要: A technique is provided for detecting the presence or absence of an abnormality with respect to an object appearing in a target image with high accuracy without using AI, even in an environment in which luminance values and colors are likely to fluctuate. An abnormality detection device (230) includes: an image input unit (232) for inputting an input image indicating an abnormality detection target object; a gradient distribution generation unit (234) for dividing the input image into predetermined regions and generating, for each region, a gradient distribution that indicates a distribution of a luminance gradient direction of the region; and an abnormality determination unit (236) for determining the presence or absence of an abnormality by analyzing the gradient distribution generated for each region.