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    MICRO ELECTRO-MECHANICAL HEATER
    1.
    发明公开
    MICRO ELECTRO-MECHANICAL HEATER 审中-公开
    微机电加热器

    公开(公告)号：EP2504671A1

    公开(公告)日：2012-10-03

    申请号：EP10833722.1

    申请日：2010-08-26

    申请人： Hysitron, Inc.

    发明人： OH, Yunje ,  ASIF, Syed Amanulla Syed ,  CYRANKOWSKI, Edward ,  WARREN, Oden, L.

    IPC分类号： G01D21/00

    摘要： A sub-micron scale property testing apparatus including a test subject holder and heating assembly. The assembly includes a holder base configured to couple with a sub-micron mechanical testing instrument and electro-mechanical transducer assembly. The assembly further includes a test subject stage coupled with the holder base. The test subject stage is thermally isolated from the holder base. The test subject stage includes a stage subject surface configured to receive a test subject, and a stage plate bracing the stage subject surface. The stage plate is under the stage subject surface. The test subject stage further includes a heating element adjacent to the stage subject surface, the heating element is configured to generate heat at the stage subject surface.

    HIGH TEMPERATURE HEATING SYSTEM
    2.
    发明公开
    HIGH TEMPERATURE HEATING SYSTEM 审中-公开
    高温加热系统

    公开(公告)号：EP2786116A1

    公开(公告)日：2014-10-08

    申请号：EP12853965.7

    申请日：2012-11-28

    申请人： Hysitron, Inc.

    发明人： OH, Yunje ,  ASIF, Syed Amanulla Syed ,  CYRANKOWSKI, Edward ,  KERANEN, Lucas Paul ,  MAJOR, Ryan ,  MISIAK, Maciej W. ,  WARREN, Oden Lee

    IPC分类号： G01N3/54

    摘要： A sample gripping and heating assembly includes an assembly housing and first and second heating grips coupled with the assembly housing. The first and second heating grips each include a gripping surface, and the gripping surfaces of the first and second heating grips are opposed to each other. Each of the first and second heating grips further includes a heating element adjacent to the gripping surface. Optionally, the sample gripping and heating assembly is included in a heating system including a probe heater having a probe heating element for heating of a probe. The heating system is included with a testing assembly having a stage coupled with the sample gripping and heating assembly, and a transducer assembly coupled with the probe heater.

    摘要翻译： 用于微米或更小尺度的机械测试的加热系统包括舞台加热器。 舞台加热器具有舞台平面，舞台加热元件分布在舞台平面上。 两个或两个以上的支架安装在舞台平面的相对两侧。 第一桥从平台平面延伸到两个或更多支撑安装座中的第一安装座，并且第二桥从平台平面延伸到两个或更多个支撑安装座中的第二安装座。 第一桥和第二桥在台平面与两个或更多个支撑座之间提供多个支撑件以相应地支撑台平面。 在另一个示例中，加热系统包括配置成加热探针作为机械测试的一部分的探针加热器。

    THREE DIMENSIONAL TRANSDUCER
    3.
    发明公开
    THREE DIMENSIONAL TRANSDUCER 有权
    维度转换器

    公开(公告)号：EP2684007A1

    公开(公告)日：2014-01-15

    申请号：EP12755144.8

    申请日：2012-03-09

    申请人： Hysitron, Inc.

    发明人： WARREN, Oden Lee ,  ASIF, Syed Amanulla Syed ,  OH, Yunje ,  FENG, Yuxin ,  CYRANKOWSKI, Edward ,  MAJOR, Ryan

    IPC分类号： G01B7/16

    CPC分类号： G01B7/16 ,  G01D5/2417 ,  G01L5/165 ,  G01N3/42 ,  G01N2203/0286 ,  G01Q60/366

    摘要： A testing instrument for mechanical testing at nano or micron scale includes a transducer body, and a coupling shaft coupled with a probe tip. A transducer body houses a capacitor. The capacitor includes first and second counter electrodes and a center electrode assembly interposed therebetween. The center electrode assembly is movable with the coupling shaft relative to the first and second counter electrodes, for instance in one or more of dimensions including laterally and normally. The center electrode assembly includes a center plate coupled with the coupling shaft and one or more springs extending from the center plate. Upper and lower plates are coupled with the center plate and cover the center plate and the one or more springs. A shaft support assembly includes one or more support elements coupled along the coupling shaft. The shaft support assembly provides lateral support to the coupling shaft.

    MICROSCOPE OBJECTIVE MECHANICAL TESTING INSTRUMENT
    7.
    发明公开
    MICROSCOPE OBJECTIVE MECHANICAL TESTING INSTRUMENT 有权
    力学测试仪器显微镜镜头

    公开(公告)号：EP2831600A1

    公开(公告)日：2015-02-04

    申请号：EP13768794.3

    申请日：2013-03-13

    申请人： Hysitron, Inc.

    发明人： ASIF, Syed Amanulla Syed ,  DAMA, Rajiv ,  MAJOR, Ryan

    IPC分类号： G01Q30/02

    CPC分类号： G01N3/40 ,  G01N3/04 ,  G01N3/068 ,  G01N3/42 ,  G01N3/56 ,  G01N2203/0078 ,  G01N2203/0647 ,  G01Q30/025 ,  G01Q60/366 ,  G01Q70/02 ,  G02B7/16 ,  G02B21/248

    摘要： An objective testing module includes a module base configured for coupling with an objective turret of a microscope. The objective testing module includes a mechanical testing assembly. The mechanical testing assembly is configured to mechanically test a sample at macro scale or less, and quantitatively determine one or more properties of the sample based on the mechanical testing. The mechanical testing assembly optionally includes a probe and one or more transducers coupled with the probe. The transducer measures one or more of force applied to a sample by the probe or displacement of the probe within the sample. In operation, an optical instrument locates a test location on a sample and the objective testing module mechanically tests at the test location with the mechanical testing assembly at a macro scale or less. The mechanical testing assembly further determines one or more properties of the sample according to the mechanical test.