COMPACT OPTO-ELECTRIC PROBE
    1.
    发明公开

    公开(公告)号:EP3845913A1

    公开(公告)日:2021-07-07

    申请号:EP20165280.7

    申请日:2020-03-24

    IPC分类号: G01R1/07

    摘要: Described are various configurations for performing efficient optical and electrical testing of an opto-electrical device using a compact opto-electrical probe. The compact opto-electrical probe can include electrical contacts arranged for a given electrical contact layout of the opto-electrical device, and optical interface with a window in a probe core that transmits light from the opto-electrical device. An adjustable optical coupler of the probe can be mechanically positioned to receive light from the device's emitter to perform simultaneous optical and electrical analysis of the device.