INSPECTION SYSTEM
    2.
    发明公开
    INSPECTION SYSTEM 审中-公开

    公开(公告)号:EP4159178A1

    公开(公告)日:2023-04-05

    申请号:EP21818509.8

    申请日:2021-06-01

    摘要: A testing system collects a specimen from a subject and measures the collected specimen to test the specimen, and includes a first unit to collect and receive the specimen, a second unit to be connected to the first unit and to preprocess the specimen before measurement, a third unit to be connected to the second unit and to measure the preprocessed specimen, and a robot provided in at least one of the first unit, the second unit, or the third unit to process the specimen.