专利检索 ap:("Koh Young Technology Inc") AND inv:"KIM, Han Rim" 第 1 页

1.

发明公开
OBJECT TESTING APPARATUS AND OBJECT TESTING METHOD USING SAME 审中-公开

公开(公告)号：EP3816614A1

公开(公告)日：2021-05-05

申请号：EP19826924.3

申请日：2019-04-16

申请人： Koh Young Technology Inc

发明人： JUNG, Choung Min , LEE, Ho Jun , PARK, Nam Kyu , KIM, Han Rim

IPC分类号： G01N21/95 , G01N21/88 , G01M99/00 , B25B5/04

摘要： An object inspection apparatus according to an embodiment disclosed herein includes: a first flipper apparatus configured to rotate a first object; a second flipper apparatus configured to rotate a second object; and a single camera device configured to move from a position corresponding to one of the first flipper apparatus and the second flipper apparatus to a position corresponding to the other, the camera device being configured to inspect object surfaces of the first object and the second object. Each of the first flipper apparatus and the second flipper apparatus includes at least one flipper unit.