公开(公告)号：EP0826220B1

公开(公告)日：2002-05-29

申请号：EP97901213.5

申请日：1997-02-07

申请人： Koninklijke Philips Electronics N.V. ,  Philips Corporate Intellectual Property GmbH

发明人： GEITTNER, Peter, Ernst, Eckart ,  LINDERS, Petrus, Wilhelmus, Johannes ,  LYDTIN, Hans-Jürgen

IPC分类号： G21K3/00

CPC分类号： G21K1/10

摘要： The X-ray examination apparatus comprises an X-ray filter for locally attenuating the X-ray beam. The X-ray filter includes a plurality of filter elements. The X-ray absorptivity of each filter element is controlled by the amount of X-ray absorbing liquid with which the filter element is filled. The filling of filter elements is controlled by a voltage. The X-ray absorbing liquid contains a suspension of very small X-ray absorbing particles.

摘要翻译： X射线检查设备包括用于局部地衰减X射线束的X射线滤波器。 该X射线滤波器包括多个滤波器元件。 每个过滤器元件的X射线吸收率由填充过滤器元件的X射线吸收液的量来控制。 过滤元件的填充由电压控制。 X射线吸收液含有非常小的X射线吸收颗粒的悬浮液。