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公开(公告)号：EP1917540B1
公开(公告)日：2014-10-01
申请号：EP06776974.5
申请日：2006-08-18
申请人： Leica Geosystems AG
发明人： WEILENMANN, Jürg
CPC分类号： G01S17/36 , G01S17/006
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公开(公告)号：EP1917540A1
公开(公告)日：2008-05-07
申请号：EP06776974.5
申请日：2006-08-18
申请人： Leica Geosystems AG
发明人： WEILENMANN, Jürg
CPC分类号： G01S17/36 , G01S17/006
摘要： Distances to targets (2a, 2b) are simultaneously determined in a method for measuring distance according to the phase measuring principle with a time discrete emission of periodic signals (7) and a sampling of received signals for generating and optionally storing sampled values, whereby the signals have signal portions that are reflected by the targets (2a, 2b) and superimposed. A statistical parameter estimation problem based on a mathematical signal model is solved in such a manner that the number of the targets (2a, 2b) for more than one target (2a, 2b) is preset or fundamentally, the number of targets is determined by the method, and the inequalities D- ≤ Dk
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公开(公告)号：EP1373834B1
公开(公告)日：2006-09-13
申请号：EP02708370.8
申请日：2002-03-27
申请人： Leica Geosystems AG
发明人： WEILENMANN, Jürg
CPC分类号： G01D5/24452 , G01D5/2449 , G01D5/2492 , G01D18/00
摘要： The invention relates to a method and device for calibrating a measuring instrument with at least two partial systems (K;M), which can be displaced with regard to one another, and with means for generating an image of at least one first partial system (K) on at least one detecting component (A) of at least one partial system. The invention provides that after establishing a mathematical model, a parameter set, which quantifies influencing factors on systematic measurement errors of the measuring instrument and which has at least one parameter, is derived from the mathematical model. Afterwards, the imaging of the structure elements (S) of a first partial system (K), said structure elements determining the relative position of a partial system, ensues on a second partial system (M). The image of the structure elements (S) of the first partial system (K) is converted into signals by the detecting component (A), and at least one signal vector is recorded. Correction values, which reduce systematic measurement errors of the measuring instrument, are derived from the estimated values of the parameter set and made available.
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公开(公告)号：EP1373834A1
公开(公告)日：2004-01-02
申请号：EP02708370.8
申请日：2002-03-27
申请人： Leica Geosystems AG
发明人： WEILENMANN, Jürg
CPC分类号： G01D5/24452 , G01D5/2449 , G01D5/2492 , G01D18/00
摘要： The invention relates to a method and device for calibrating a measuring instrument with at least two partial systems (K;M), which can be displaced with regard to one another, and with means for generating an image of at least one first partial system (K) on at least one detecting component (A) of at least one partial system. The invention provides that after establishing a mathematical model, a parameter set, which quantifies influencing factors on systematic measurement errors of the measuring instrument and which has at least one parameter, is derived from the mathematical model. Afterwards, the imaging of the structure elements (S) of a first partial system (K), said structure elements determining the relative position of a partial system, ensues on a second partial system (M). The image of the structure elements (S) of the first partial system (K) is converted into signals by the detecting component (A), and at least one signal vector is recorded. Correction values, which reduce systematic measurement errors of the measuring instrument, are derived from the estimated values of the parameter set and made available.
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公开(公告)号：EP0826137B1
公开(公告)日：2001-04-11
申请号：EP97904399.9
申请日：1997-02-10
申请人： Leica Geosystems AG
发明人： GNEPF, Silvio , WEILENMANN, Jürg
IPC分类号： G01C17/38
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