公开(公告)号：EP4428517A2

公开(公告)日：2024-09-11

申请号：EP24178638.3

申请日：2018-12-03

申请人： MTS Systems Corporation

发明人： MEYER, Richard A. ,  BONNER, Dustin ,  CHUA, David Yap ,  CHRISTIANSEN, John Albert

IPC分类号： G01N3/08

CPC分类号： G01N3/04 ,  G01N3/08 ,  G01B5/30

摘要： An extensometer structure is provided comprising a mounting assembly having a first mounting block movable relative to a second mounting block; an extensometer structure joined to the second mounting block and including: a first extension arm; and a second extension arm movably connected to the first extension arm; and a force generating assembly coupled to the extensometer structure with a spring element to urge the extension arms toward a test specimen.

公开(公告)号：EP3717862A1

公开(公告)日：2020-10-07

申请号：EP18830067.7

申请日：2018-12-03

申请人： MTS Systems Corporation

发明人： MEYEY, Richard A. ,  BONNER, Dustin ,  CHUA, David Yap ,  CHRISTIANSEN, John Albert

IPC分类号： G01B5/30 ,  G01N3/04