公开(公告)号：EP3724902A1

公开(公告)日：2020-10-21

申请号：EP18807950.3

申请日：2018-11-21

申请人： Maschinenfabrik Reinhausen GmbH

发明人： BILINSKI, Enrico ,  ULLRICH, Clemens ,  SIEBERT, Günther

IPC分类号： H01F27/36 ,  H01F37/00 ,  G01R31/14 ,  G01R31/333

公开(公告)号：EP2820434A1

公开(公告)日：2015-01-07

申请号：EP13702354.5

申请日：2013-01-15

申请人： Maschinenfabrik Reinhausen GmbH

发明人： HINOW, Martin ,  STEPHAN, Uwe ,  SIEBERT, Günther ,  BERGMANN, Ralf ,  THIEDE, Andreas

IPC分类号： G01R31/00

CPC分类号： G01R31/40 ,  G01R1/20 ,  G01R31/00 ,  G01R31/02 ,  G01R31/14 ,  G01R31/42

摘要： The present invention relates to a test system for high-voltage technology devices, in particular shunt reactors, as defined in the preamble of independent patent claim 1. The invention also relates to a method which can be carried out with this test system and is intended to test high-voltage technology devices according to coordinate patent claim 5. The general idea of the test system according to the invention is to provide a continuously adjustable inductance and a capacitance, which can be adjusted in discrete steps, on the secondary side of the test transformer in such a manner that said components form a series resonant circuit together with the test object in the form of an inductance. In the method which can be carried out with the test system according to the invention, a rough adjustment of the test system is carried out using the discretely adjustable capacitances of the capacitor bank by connecting individual capacitances of the capacitor bank via an iterative process if an undercapacitance is measured in the test system by means of a measuring device or by disconnecting individual capacitances if an overcapacitance is measured by means of the measuring device until a predefined threshold value of an overcapacitance prevails, with the result that fine tuning of the test system is then carried out by means of the continuously adjustable inductance in such a manner that said components form, together with the test object in the form of an inductance, a series resonant circuit which can be tuned to the point of resonance thereof.

摘要翻译： 本发明涉及一种用于独立权利要求1的前序部分所定义的高电压技术装置，特别是并联电抗器的测试系统。本发明还涉及一种可以用该测试系统执行的方法， 根据坐标专利权利要求5来测试高压技术装置。根据本发明的测试系统的总体思想是提供一个连续可调的电感和一个可以在离散步骤中调整的电容，在二次侧 测试变压器，使得所述组件以电感的形式与测试对象一起形成串联谐振电路。 在可以用根据本发明的测试系统执行的方法中，通过使用电容器组的离散可调电容通过迭代过程连接电容器组的各个电容来进行测试系统的粗略调整，如果 通过测量装置在测试系统中测量欠电压，或者如果通过测量装置测量过电容，直到超电容的预定义阈值占优势，则测试系统的微调为 然后通过连续可调的电感进行，使得所述部件与电感形式的测试对象一起形成可调谐到其共振点的串联谐振电路。