专利检索 ap:("Mitutoyo Corporation" OR "Mori Seiki Co., Ltd." OR "OKUMA CORPORATION" OR "Yamazaki, Kazuo") AND inv:"UNEME, Masayoshi, Mori Seiki Co. Ltd." 第 1 页

1.

发明授权
APPARATUS AND METHOD CONCERNING ANALYSIS AND GENERATION OF A PART PROGRAM FOR MEASURING COORDINATES AND SURFACE PROPERTIES 有权
标题翻译：方法和设备用于分析和程序用于测量坐标和表面性质GENERATION

公开(公告)号：EP1028306B1

公开(公告)日：2008-10-15

申请号：EP98940599.8

申请日：1998-08-28

申请人： Mitutoyo Corporation , Mori Seiki Co., Ltd. , OKUMA CORPORATION , Yamazaki, Kazuo

发明人： YAMAZAKI, Kazuo , ZHANG, Yuwu, Mitutoyo Corporation , UNEME, Masayoshi, Mori Seiki Co. Ltd. , FUKAYA, Yasushi, Okuma Corporation

IPC分类号： G01B21/00 , G01B21/04 , G01B21/30

CPC分类号： G01B21/04 , G01B21/00

摘要： A part program is analyzed and measurement information or measurement conditions are extracted in the measurement of coordinates and surface properties under control of the part program. Optimal measurement conditions in the actual measurement are reflected on the part program by storing the extracted measurement conditions rewritably, so that actual measurement conditions can be added to the subsequent measurement control.