CONTACT PROBE UNIT
    1.
    发明授权
    CONTACT PROBE UNIT 失效
    的接触探头单元

    公开(公告)号:EP0950191B1

    公开(公告)日:2002-03-13

    申请号:EP97950425.5

    申请日:1997-12-26

    IPC分类号: G01R1/067

    摘要: In an electroconductive contact probe unit, the electroconductive needle member is axially slidably received in a support hole formed in an insulating support plate, and is urged by the compression coil spring wound around a stem portion of the electroconductive needle member in a direction to project out of the support hole. The inner end of the compression coil spring is provided with a closely wound portion in which adjacent turns of the coil wire contact each other in the free state of the compression coil spring. As the support plate is lowered toward the object to be tested and the compression coil spring is compressed, the compression coils snakes or otherwise curves in the support hole, causing the inner surface of the closely wound portion to come into contact with the outer circumferential surface of the stem portion. Thus, the electric signal is conducted axially through the closely wound portion, instead of the spiral path along a coarsely wound portion of the compression coil spring so that the inductance and the electric resistance of the contact probe unit can be reduced. At the same time, the coarsely wound portion of the compression coil spring provides the necessary spring force for the needle member.