公开(公告)号：EP2163882A1

公开(公告)日：2010-03-17

申请号：EP08722185.9

申请日：2008-03-14

申请人： National University Corporation Shizuoka University

发明人： SAITO, Takayuki ,  SANADA, Toshiyuki ,  OZAWA, Yusuke

IPC分类号： G01N13/02 ,  G01N21/17

CPC分类号： G01N13/02 ,  G01N21/431

摘要： Low-cost interface property measuring device and method enabling high-precision and simple measurement of an interface property. The interface property measuring device comprises an optical fiber probe (1) having a first end face (2) at least part of which is inclined with respect to a direction perpendicular to a fiber axis, a light supplying means (24) for supplying light from a second end face on the side opposite to the first end face of the optical fiber probe, a reflected light amount measuring means (24) for measuring the reflected light amount obtained by the light supplied by the light supplying means being reflected by the first end face and returning to the second end face, and a moving means (18) for moving at least one of the optical fiber probe and an object (21) to be measured such that the first end face of the optical fiber probe passes through an interface (23) of the object (21) at a constant speed, and the interface property measuring device acquires the interface property of the object to be measured according to the result of measurement of the reflected light amount when the first end face of the optical fiber probe passes through the interface of the object to be measured.

摘要翻译： 低成本接口性能测量装置和方法能够实现高精度和简单的测量接口性能。 界面特性测量装置包括：光纤探针（1），其具有至少一部分相对于与光纤轴垂直的方向倾斜的第一端面（2），用于提供来自 第二端面与光纤探针的第一端面相对的一侧;反射光量测量装置，用于测量由光供给装置提供的光获得的反射光量，该反射光量由第一端 并且返回到第二端面;以及移动装置，用于移动光纤探针和被测量物体中的至少一个，使得光纤探针的第一端面通过界面 （21）中的第一端面（23），并且界面性质测量装置根据反射光量的测量结果来获取被测量物体的界面特性，当第一端面 的光纤探头通过待测物体的界面。