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公开(公告)号:EP4174717A1
公开(公告)日:2023-05-03
申请号:EP21833757.4
申请日:2021-06-24
发明人: CHEN, Zhiqiang , ZHAO, Ziran , JIN, Yingkang , HE, Xiaoyi , ZHANG, Li , ZHAO, Mengjiao , ZHENG, Zhimin , ZHANG, Yihai , LI, Yaning , FENG, Xiaoxiao
摘要: There is provided a server (310; 420) of a checking system based on a millimeter wave security inspection device, connected to a security inspection instrument (320a, 320b; 410) through a switching system (340; 430), the server (310; 420) includes a memory (1020) and a processor (1010), the memory (1020) stores instructions, and the instructions, when executed by the processor (1010), cause the processor (1010) to: receive a scanned image of an object and an ATR image interpretation result of the object from the security inspection instrument (320a, 320b; 410), wherein the ATR image interpretation result is obtained by the security inspection instrument (320a, 320b; 410) performing an automatic threat recognition (ATR) image interpretation on the scanned image, and perform a manual inspection task on the object and perform an image interpretation task on the scanned image according to a working mode, wherein the working mode indicates whether the checking system is provided with a manual inspection station (320 1 , 320 2 , 320 3 , 320 4 ; 440) and an image interpretation station (330 1 , 330 2 , 330 3 ; 450). There is further provided a checking system including the server (310; 420), a switching system (340; 430), a security inspection instrument (320a, 320b; 410), at least one manual inspection station (320 1 , 320 2 , 320 3 , 320 4 ; 440) and at least one image interpretation station (330 1 , 330 2 , 330 3 ; 450), and a checking method based on the server (310; 420).