ELÉMENT DE DÉTECTION QUANTIQUE À FAIBLE BRUIT ET PROCÉDÉ DE FABRICATION D'UN TEL ÉLÉMENT DE PHOTODÉTECTION
    3.
    发明公开
    ELÉMENT DE DÉTECTION QUANTIQUE À FAIBLE BRUIT ET PROCÉDÉ DE FABRICATION D'UN TEL ÉLÉMENT DE PHOTODÉTECTION 审中-公开
    随着对制造这种光检测元件低噪声和方法量子检测元件

    公开(公告)号:EP3084843A1

    公开(公告)日:2016-10-26

    申请号:EP14825129.1

    申请日:2014-12-17

    摘要: According to one aspect, the invention relates to an element for quantum photodetection of an incident radiation in a spectral band centred around a central wavelength λ
    0 , having a front surface intended for receiving said radiation, and including: a stack of layers of semiconductor material forming a PN or PIN junction and including at least one layer made of an absorbent semiconductor material having a cut-off wavelength λ
    c > λ
    0 , the stack of layers of semiconductor material forming a resonant optical cavity; and a structure for coupling the incident radiation with the optical cavity such as to form a resonance at the central wavelength λ
    0 allowing the absorption of more than 80 % in the layer of absorbent semiconductor material at said central wavelength, and an absence of resonance at the radiative wavelength λ
    rad , wherein the radiative wavelength λ
    rad is the wavelength for which, at operating temperature, the radiative recombination rate is the highest.

    摘要翻译: 。根据一个方面,本发明涉及一种用于量子光检测入射辐射的元件上在频谱频带为中心的周围的中心波长λ0,具有旨在用于前表面接收所述辐射,并且包括:半导体材料的层的堆叠形成 一个pn或pin结,并且包括具有截止波长由吸收性半导体材料的至少一个层λ0>λ0,形成光学谐振腔的半导体材料层的叠层; 和用于耦合入射辐射与所述光学谐振腔的结构:如,以形成在中心波长λ0允许的80%以上的在所述中心波长在吸收半导体材料的层中的吸收的共振,并且在不存在共振在 辐射波长λrad,worin辐射波长λrad为哪个波长,在操作温度下,辐射复合率是最高的。