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公开(公告)号:EP0699998A1
公开(公告)日:1996-03-06
申请号:EP95113256.2
申请日:1995-08-23
IPC分类号: G06F11/24 , G01R31/3173
CPC分类号: G01R31/3004
摘要: An object of the present invention is to make it easy to realize a method of measuring a current which flows upon deactivation of a semiconductor integrated circuit in order to test whether a damaged transistor exists in the semiconductor integrated circuit.
In order to achieve the above object, the present invention provides a semiconductor integrated circuit comprising an input node supplied with an input voltage, a reference node supplied with a reference voltage, a first source potential node supplied with a first source potential level, a second source potential node supplied with a second source potential level, a sense circuit connected between the first source potential node and the second source potential node and brought into an operating state during a period in which the first source potential level is supplied, the sense circuit comparing the input voltage and the reference voltage and outputting the result of comparison to a first node, a buffer circuit connected between the first node and an output node and adapted to output a voltage corresponding to the voltage appearing at the first node to the output node, and a first switching circuit connected between the first source potential node and the sense circuit and adapted to selectively connect between the sense circuit and the first source potential node in response to the voltage supplied to the reference node.摘要翻译: 本发明的一个目的是使得容易实现一种测量半导体集成电路去激活时流过的电流的方法,以便测试半导体集成电路中是否存在损坏的晶体管。 为了实现上述目的,本发明提供了一种半导体集成电路,其包括被提供有输入电压的输入节点,提供有参考电压的参考节点,被提供有第一源电位电平的第一源极电位节点, 提供有第二源电位电平的源电位节点,连接在第一源电位节点和第二源电位节点之间并在提供第一源极电位电平的时段期间进入工作状态的感测电路,感测电路比较 输入电压和参考电压,并将比较结果输出到第一节点,缓冲电路连接在第一节点和输出节点之间,并且适于将对应于出现在第一节点处的电压的电压输出到输出节点, 以及第一开关电路,连接在第一源极电位节点和感测电路之间并适于 响应于提供给参考节点的电压,选择性地连接在感测电路和第一源极电位节点之间。
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公开(公告)号:EP0699998B1
公开(公告)日:2000-07-05
申请号:EP95113256.2
申请日:1995-08-23
IPC分类号: G06F11/24 , G01R31/3173
CPC分类号: G01R31/3004
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