公开(公告)号：EP2284529A1

公开(公告)日：2011-02-16

申请号：EP10171040.8

申请日：2010-07-28

申请人： Olympus NDT

发明人： Faucher, Dennis ,  Lepage, Benoit

IPC分类号： G01N27/90

CPC分类号： G01N27/9026

摘要： An eddy current probe assembly suitable for inspecting a test object with longitudinal shape, being passed through the assembly in the object's axial direction during an inspection session, the probe assembly comprising multiple probe modules being disposed in a radial plane and with the modules partially overlaying on each other forming an iris structure encircling an inspection zone, wherein a movement in unison of each of the probe modules closer to or further away from the center of the inspection zone makes the inspection zone enlarged or contracted. Spring tension is applied on each of the probe modules so that constant life-off in maintained between the probe modules and the test surface. Array of eddy current elements for each probe module and multiple layers of probe modules can be employed to achieve complete coverage of the test surface. The radial cross-sectional shapes of the test objects can be of round or polygonal.

摘要翻译： 适于检验测试对象具有纵向形状，检查会话的试验过程中，通过在对象的轴向方向上的组件被传递的涡流组件，所述探针组件包括多个测试模块被布置在径向平面中，并与模块部分地覆盖上 测试海誓山盟形成光圈结构中的检查区包围，在每个模块中的一致worin运动从进一步的检查区域的中心接近或离开使得扩大或收缩的检查区域。 弹簧张力被施加于每个模块试验的象在测试模块和测试表面之间保持恒定寿命断。 对于每个测试模块涡流元件与测试模块的多个层的阵列可以被用来实现测试表面的完全覆盖。 所述测试对象的径向横截面形状可以是圆形或多边形的。

公开(公告)号：EP2133691A3

公开(公告)日：2011-03-09

申请号：EP09162688.7

申请日：2009-06-15

申请人： Olympus NDT

发明人： Lepage, Benoit ,  Faucher, Denis

IPC分类号： G01N27/90

CPC分类号： G01N27/902 ,  G01N27/904

摘要： Disclosed is a method and an NDT/NDI probe deploying a slit (14) or a flexible joint of probe bending region, preferably between two rows of probe elements (12,12') to allow free bending between rows of probe elements and along the direction of the rows of elements and to allow two adjacent rows of elements to bend individually along its own natural bending lines perpendicular to the direction of the rows of elements.

公开(公告)号：EP2284529B1

公开(公告)日：2019-05-15

申请号：EP10171040.8

申请日：2010-07-28

申请人： Olympus NDT

发明人： Faucher, Dennis ,  Lepage, Benoit

IPC分类号： G01N27/90

公开(公告)号：EP2133691B1

公开(公告)日：2013-01-02

申请号：EP09162688.7

申请日：2009-06-15

申请人： Olympus NDT

发明人： Lepage, Benoit ,  Faucher, Denis

IPC分类号： G01N27/90

CPC分类号： G01N27/902 ,  G01N27/904

公开(公告)号：EP2133691A2

公开(公告)日：2009-12-16

申请号：EP09162688.7

申请日：2009-06-15

申请人： Olympus NDT

发明人： Lepage, Benoit ,  Faucher, Denis

IPC分类号： G01N27/90

CPC分类号： G01N27/902 ,  G01N27/904

摘要： Disclosed is a method and an NDT/NDI probe deploying a slit (14) or a flexible joint of probe bending region, preferably between two rows of probe elements (12,12') to allow free bending between rows of probe elements and along the direction of the rows of elements and to allow two adjacent rows of elements to bend individually along its own natural bending lines perpendicular to the direction of the rows of elements.

摘要翻译： 公开了一种方法和NDT / NDI探针，其展开狭缝（14）或探针弯曲区域的柔性接头，优选在两排探针元件（12,12'）之间，以允许探针元件的行之间的自由弯曲并且沿着 并且允许两个相邻排的元件沿其自身的垂直于元件行的方向的自然弯曲线单独弯曲。

公开(公告)号：EP2037261A1

公开(公告)日：2009-03-18

申请号：EP08164090.6

申请日：2008-09-10

申请人： Olympus NDT

发明人： Lepage, Benoit ,  Langlois, Pierre ,  Drummy, Michael

IPC分类号： G01N27/90

CPC分类号： G01N27/9013

摘要： A phased scanning method and phased scan eddy current array probe suitable for in-situ eddy current inspection of a structure without mechanical scanning. Overlapping subsets of the sensor elements within the array probe are dynamically connected in series and sequentially scanned to simulate the mechanical motion of a conventional array probe along a test surface. An algorithm to effectively balance the scan data is provided which comprises obtaining a reference scan at the time of probe installation, storing the measurement data from this reference scan in a memory device located within the probe, subtracting this reference curve from the curve obtained by all subsequent measurement scans to produce an adjusted curve, and processing the resulting adjusted curve through a high pass filter. A technique for verifying sensor elements of an eddy current array probe after permanent or semi-permanent installation against a test structure is also provided.

摘要翻译： 分阶段扫描方法和适用于无机械扫描的结构的原位涡流探伤相控扫描涡流arrayprobe。 在arrayprobe内的传感器元件的重叠子集被动态地串联连接，并且依次扫描，以模拟沿一个测试表面的传统arrayprobe的机械运动。 提供了一种算法，以有效地平衡该扫描数据，其包括在试用装的时间获得参考扫描，从在位于样品内的存储器的设备本参考扫描存储的测量数据，减去由所有获得的曲线该基准曲线 随后的测量扫描，以产生调整后的曲线上，并通过高通滤波器来处理所得到的调整后的曲线。 因此，提供一种用于验证对测试结构的永久或半永久安装后的涡电流arrayprobe的传感器元件技术。

公开(公告)号：EP2642281B1

公开(公告)日：2015-01-07

申请号：EP13000076.3

申请日：2013-01-09

申请人： Olympus NDT, Inc.

发明人： Lepage, Benoit

IPC分类号： G01N27/90

CPC分类号： G01N27/9053

摘要： The invention provides a method for compensating the sensitivity variations induced by lift-off variations for an eddy current array probe. The invention uses the eddy current array probe coils in two separate ways to produce a first set of detection channels and a second set of lift-off measurement channels without the need to add coils dedicated to the lift-off measurement operation. Another aspect of the invention provides an improved calibration process which combines the detection and lift-off measurement channel calibration on a simple calibration block including a reference defect without the need of a pre-defined lift-off condition.

公开(公告)号：EP2693210A1

公开(公告)日：2014-02-05

申请号：EP13003822.7

申请日：2013-08-01

申请人： Olympus NDT, Inc.

发明人： Lepage, Benoit ,  Dancause, Yves

IPC分类号： G01N27/90

CPC分类号： G01N27/904 ,  G01N27/902

摘要： Eddy current array inspection assembly comprising a pluralty of sensors, a first and second probe supports, a manipulator, a manipulatro link member and a driving handle. The assembly is capable of providing reliable and durable inspections of dovetail slots without the use of an external guiding mechanism. The probe support embodies a rigid yet expandable core, exerting a force pushing the array probe against the inner cavity of the dovetails. The pushing force is strategically located in critical areas of the dovetail leading the array probe to be self-guiding into the dovetail.

摘要翻译： 涡流阵列检查组件，其包括传感器，第一和第二样品支架，机械手，把手manipulatro连杆构件和驱动的pluralty。 该组件能够提供燕尾槽的可靠和持久的检查，而无需使用外部导向机构构成。 样品支架体现刚性但可膨胀的芯，施加力推动arrayprobe对燕尾榫的内腔。 推力地理位置优越，位于领先arrayprobe是自引导到燕尾榫部的关键领域。

公开(公告)号：EP2642281A1

公开(公告)日：2013-09-25

申请号：EP13000076.3

申请日：2013-01-09

申请人： Olympus NDT, Inc.

发明人： Lepage, Benoit

IPC分类号： G01N27/90

CPC分类号： G01N27/9053

摘要： The invention provides a method for compensating the sensitivity variations induced by lift-off variations for an eddy current array probe. The invention uses the eddy current array probe coils in two separate ways to produce a first set of detection channels and a second set of lift-off measurement channels without the need to add coils dedicated to the lift-off measurement operation. Another aspect of the invention provides an improved calibration process which combines the detection and lift-off measurement channel calibration on a simple calibration block including a reference defect without the need of a pre-defined lift-off condition.

摘要翻译： 本发明提供一种用于补偿试验诱导的通过剥离变化至涡流阵列的灵敏度变化的方法。 本发明使用在两个分开的方式涡流探针阵列线圈，以产生第一组检测通道和第二组剥离测量信道的，而不需要添加专用于剥离测量操作线圈。 本发明的另一个方面提供了一种改进的校准过程结合了简单的校准块包括而不需要预先定义的剥离状态的基准缺陷的检测和剥离测量通道校准。