MULTI-EXPONENTIAL ERROR EXTRAPOLATION
    1.
    发明公开

    公开(公告)号:EP3933718A1

    公开(公告)日:2022-01-05

    申请号:EP20183835.6

    申请日:2020-07-02

    IPC分类号: G06N10/00 G06F17/17

    摘要: A method of mitigating errors when using a quantum computer comprising: performing S11 a first operation 21 on the state of a qubit; wherein the first operation 21 has a first error rate 32; obtaining S12 a first measurement of the average state of the qubit; modifying S13 the error rate of the quantum computer from the first error rate 32 to a second error rate 34; performing S14 a second operation 23 on the state of the qubit; wherein the second operation 23 has the second error rate 34; obtaining S15 a second measurement of the average state of the qubit; fitting S16 the first measurement 31 and the second measurement 33 to a multi-exponential decay curve 35; and extrapolating S17 the average state of the qubit at a third error rate 37 using the fitted curve 35, wherein the third error rate 37 is lower than the first error rate 32 and the second error rate 34.

    ERROR MITIGATION TECHNIQUES
    5.
    发明公开

    公开(公告)号:EP3933717A1

    公开(公告)日:2022-01-05

    申请号:EP20183833.1

    申请日:2020-07-02

    IPC分类号: G06N10/00 G06F17/17

    摘要: A method of mitigating errors in quantum computing, wherein the method comprises: performing S101 an operation on the state of a qubit in a group of qubits a plurality of times, wherein the operation has a first error rate, and wherein each performance of the operation comprises: performing a first operation comprising: a gate operation, a symmetry operation, and a first basis operation; or performing a second operation comprising: the gate operation, the symmetry operation, and a second basis operation; and measuring the state of the qubit; wherein the probability of performing the first operation is a first probability, and the probability of performing the second operation is a second probability; obtaining S102 a symmetry measurement for the group of qubits using the symmetry operation; wherein the symmetry measurement is a first symmetry outcome or a second symmetry outcome; obtaining S103 a first state measurement by determining the average state of the qubit for the first symmetry outcome; obtaining S104 a second state measurement by determining the average state of the qubit for the second symmetry outcome; fitting S105 the first state measurement to a first curve and the second state measurement to a second curve; and extrapolating S106 the average state of the qubit at a second error rate using the first and second fitted curves; wherein the second error rate is lower than the first error rate.