公开(公告)号：EP0757839A1

公开(公告)日：1997-02-12

申请号：EP96901091.0

申请日：1996-02-12

申请人： PHILIPS ELECTRONICS N.V.

发明人： THELOSEN, Jacobus, Antonius ,  DRIES, Johan, Juliana ,  MANSCHOT, Bernardus, Hermanus, Maria

IPC分类号： G01N23 ,  G21K1 ,  G21K3

CPC分类号： A61B6/06 ,  G21K1/04

摘要： An X-ray examination apparatus comprises a collimator unit (4) with a diaphragm (8) for limiting the X-ray beam (2), the circular aperture (31) of the diaphragm (8) having a first diameter for a first diaphragm and a second diameter for a second diaphragm setting. The collimator unit (4) also comprises an X-ray filter (20) with detachable filter elements (21).

公开(公告)号：EP0757839B1

公开(公告)日：1999-12-22

申请号：EP96901091.7

申请日：1996-02-12

申请人： Koninklijke Philips Electronics N.V.

发明人： THELOSEN, Jacobus, Antonius ,  DRIES, Johan, Juliana ,  MANSCHOT, Bernardus, Hermanus, Maria

IPC分类号： G21K1/04 ,  G21K1/10 ,  G21K3/00

CPC分类号： A61B6/06 ,  G21K1/04

摘要： An X-ray examination apparatus comprises a collimator unit (4) with a diaphragm (8) for limiting the X-ray beam (2), the circular aperture (31) of the diaphragm (8) having a first diameter for a first diaphragm and a second diameter for a second diaphragm setting. The collimator unit (4) also comprises an X-ray filter (20) with detachable filter elements (21).