专利检索 ap:("POSTECH FOUNDATION" OR "LEE GI NO" OR "KIM SUNG TAE") AND inv:"JUNG KI-HYO" 第 1 页

1.

发明公开
APPARATUS FOR MEASURING FORCE APPLIED BY THE HAND, ANALYSING APPARATUS AND SYSTEM 有权
标题翻译：用于测量用手涂抹动力和破碎系统和ANALYSEVORRICHUNG

公开(公告)号：EP1831661A4

公开(公告)日：2008-02-20

申请号：EP05822204

申请日：2005-12-27

申请人： POSTECH FOUNDATION , LEE GI NO , KIM SUNG TAE

发明人： JUNG KI-HYO , KONG YOUNG-KYUN , KWON O-CHAE , PARK SUNG-HA , YOU HEE-CHEON , LEE MIN-JEONG , LEE GI-NO

IPC分类号： G01L1/18 , G01L1/20

CPC分类号： G01L1/205

摘要： Provided is an apparatus for measuring force applied to a hand when a worker works in an industrial field. The measuring apparatus includes a glove with a plurality of sensors on the palm side, a case with a band, and a register for receiving and registering measurement signals obtained in the sensors, the register being mounted in the case.