公开(公告)号：EP1734914A4

公开(公告)日：2012-11-07

申请号：EP04811597

申请日：2004-11-18

申请人： QED TECHNOLOGIES INT INC

发明人： MURPHY PAUL ,  FLEIG JON ,  FORBES GREG

IPC分类号： G01B11/26 ,  B23Q17/22 ,  B23Q17/24 ,  G01B11/27 ,  G01C1/00 ,  G01C9/00

CPC分类号： G01B11/272 ,  B23Q17/22 ,  B23Q17/2495

公开(公告)号：EP2926082A4

公开(公告)日：2016-08-17

申请号：EP13858732

申请日：2013-11-22

申请人： QED TECHNOLOGIES INT INC

发明人： KULAWIEC ANDREW ,  MURPHY PAUL ,  FLEIG JON

IPC分类号： G01B11/24 ,  G01M11/02

CPC分类号： G01M11/005 ,  G01M11/025 ,  G01M11/0271

摘要： An instrument for measuring aspheric optical surfaces includes both an optical wavefront sensor and a single-point optical profilometer. The optical wavefront sensor measures surface height variations throughout one or more areas of an aspheric test surface. The single-point profilometer measures surface height variations along one or more traces on the aspheric test surface. At least one of the traces intersects at least one of the areas, and respective spatial frames of reference for the traces and areas are relatively adapted to each other by minimizing differences between points of nominal coincidence between the areas and traces.