APPARATUS AND METHOD FOR CALIBRATING A SCANNING HEAD
    2.
    发明公开
    APPARATUS AND METHOD FOR CALIBRATING A SCANNING HEAD 审中-公开
    用于校准扫描头的装置和方法

    公开(公告)号:EP2162701A1

    公开(公告)日:2010-03-17

    申请号:EP08775757.1

    申请日:2008-06-18

    申请人: Renishaw PLC

    IPC分类号: G01B21/04

    CPC分类号: G01B21/042

    摘要: A method of calibrating an angular measurement scale in a motorised articulated scanning head (16) using a reference artefact (40; 60; 80) is described. The method comprises the step of rotating a surface sensing device, such as a scanning probe (28), mounted on the scanning head (16) about at least one axis (A1, A2) of the scanning head (16) to move the surface sensing device into a plurality of different angular orientations relative to the reference artefact (40; 60; 80). A step is then performed of measuring, with the surface sensing device, at least one property of the reference artefact (40; 60; 80) at each of the different angular orientations. An error map or function is then created for at least one measurement scale of the scanning head using the properties of the reference artefact (40; 60; 80) measured and optionally known or calibrated properties of that reference artefact (40; 60; 80). The method may comprise use of co-ordinate positioning apparatus, such as a co-ordinate measuring machine (14), to move the scanning head (16). The reference artefact (40; 60; 80) may comprise a single feature or an array of features (46; 66).

    摘要翻译: 描述了使用参考制品(40; 60; 80)来校准电动铰接式扫描头(16)中的角度测量标尺的方法。 该方法包括以下步骤:围绕扫描头(16)的至少一个轴线(A1,A2)旋转安装在扫描头(16)上的诸如扫描探针(28)的表面感测设备以移动表面 感测装置分成相对于参考制品(40; 60; 80)的多个不同的角度取向。 然后执行用表面感测装置在不同角度方向中的每一个处测量参考制品(40; 60; 80)的至少一个特性的步骤。 然后使用所测量的参考制品(40; 60; 80)的特性和该参考制品(40; 60; 80)的任选已知或校准特性为扫描头的至少一个测量标度创建误差图或函数, 。 该方法可以包括使用诸如坐标测量机(14)之类的坐标定位设备来移动扫描头(16)。 参考制品(40; 60; 80)可以包括单个特征或特征阵列(46; 66)。

    CALIBRATION OF A CONTACT PROBE
    3.
    发明公开
    CALIBRATION OF A CONTACT PROBE 审中-公开
    校准的接触式探头

    公开(公告)号:EP3014215A1

    公开(公告)日:2016-05-04

    申请号:EP14735655.4

    申请日:2014-06-26

    申请人: Renishaw PLC

    IPC分类号: G01B21/04

    摘要: A method of calibrating a contact probe having a contact element includes measuring with the contact probe a first geometric property of a calibrated artifact and a second geometric property of the or a further calibrated artifact. The first and second geometric properties are such that a deviation between a measured value and the expected value, resulting from a difference between an effective diameter of the contact element and an assumed diameter used for determining the measured value, has the opposite sign for each of the first and second geometric properties. The method further includes identifying a difference in the effective diameter of the contact element from the assumed diameter including comparing deviations of the measured value to the expected value for each of the first and second geometric properties to determine whether there is a difference in the deviations.

    APPARATUS AND METHOD FOR SURFACE MEASUREMENT
    4.
    发明公开
    APPARATUS AND METHOD FOR SURFACE MEASUREMENT 审中-公开
    用于表面测量的装置和方法

    公开(公告)号:EP2140225A1

    公开(公告)日:2010-01-06

    申请号:EP08737094.6

    申请日:2008-04-23

    申请人: Renishaw PLC

    摘要: A method of determining the dimensions and location of a surface feature, for example a valve seat. The surface of the feature is measured, for example using a spiral scan path with a tactile probe and the multiple data points acquired from the scan are used to create a digitized image. The digitized image is fitted to a nominal image (e.g. CAD data) of the surface feature. The deviation of the digitized image from the nominal image is used to determine at least one of the dimensions, location and form deviation of the surface feature.

    摘要翻译: 确定表面特征的尺寸和位置的方法,例如阀座。 例如使用具有触觉探针的螺旋扫描路径来测量特征的表面,并且使用从扫描获取的多个数据点来创建数字化图像。 数字化图像被拟合到表面特征的标称图像(例如CAD数据)。 数字化图像与标称图像的偏差用于确定表面特征的尺寸,位置和形状偏差中的至少一个。

    PROBE CALIBRATION
    5.
    发明公开
    PROBE CALIBRATION 有权
    TASTKOPFKALIBRIERUNG

    公开(公告)号:EP1877732A2

    公开(公告)日:2008-01-16

    申请号:EP06726891.2

    申请日:2006-04-25

    申请人: Renishaw plc

    IPC分类号: G01C25/00 G01B21/04

    CPC分类号: G01B21/042

    摘要: A method of calibrating a probe is disclosed said probe being mounted on a machine and having a stylus with a workpiece contacting tip, comprising calculating calibration information for the probe for a first orientation of the probe, and rotating the calibration information by an angle to obtain a probe calibration information for when the probe is oriented by that angle with respect to the first orientation. Also disclosed is a method of calibrating a probe during a measurement process. The calibration information may include a vector which relates probe head axes to machine axes; a calibration matrix; datum data; an inertial matrix. The stylus tip may be datumed at the orientation of the probe or inferred from datum information obtained at different orientations. The rotation step may be carried out by a software/computer program which may be stored on a controller for the machine.

    APPARATUS AND METHOD FOR SURFACE MEASUREMENT

    公开(公告)号:EP2140225B1

    公开(公告)日:2018-08-22

    申请号:EP08737094.6

    申请日:2008-04-23

    申请人: Renishaw PLC

    摘要: A method of determining the dimensions and location of a surface feature, for example a valve seat. The surface of the feature is measured, for example using a spiral scan path with a tactile probe and the multiple data points acquired from the scan are used to create a digitized image. The digitized image is fitted to a nominal image (e.g. CAD data) of the surface feature. The deviation of the digitized image from the nominal image is used to determine at least one of the dimensions, location and form deviation of the surface feature.

    MEASUREMENT METHOD
    10.
    发明公开
    MEASUREMENT METHOD 审中-公开
    MESSVERFAHREN

    公开(公告)号:EP2364427A2

    公开(公告)日:2011-09-14

    申请号:EP09749174.0

    申请日:2009-10-29

    申请人: Renishaw PLC

    IPC分类号: G01B5/008 G01B5/20 G01B21/04

    摘要: This invention relates to a method for measuring a feature of an object that comprises obtaining a representation of at least the feature on the object by acquiring multiple data points via surface measurement of at least the feature. A model substantially replicating at least the feature of the object is fitted to the representation. The model comprises parameters defining at least two independently alterable portions that are linked at a common point. The fitting comprises changing the form of the model by altering at least one of the at least two independently alterable portions. The method also comprises obtaining information regarding at least the feature from the fitted model.

    摘要翻译: 本发明涉及一种用于测量对象的特征的方法,其包括通过至少所述特征的表面测量获取多个数据点来获得所述对象上的至少所述特征的表示。 基本上复制对象的特征的模型适合于表示。 该模型包括定义在公共点处链接的至少两个独立可变部分的参数。 配件包括通过改变至少两个可独立改变的部分中的至少一个来改变模型的形式。 该方法还包括从拟合模型获得关于至少特征的信息。