公开(公告)号：EP4063814A1

公开(公告)日：2022-09-28

申请号：EP21216744.9

申请日：2021-12-22

申请人： RichWave Technology Corp.

发明人： Wu, Po-Wei ,  Peng, Tien-Yun ,  Chen, Chih-Sheng

IPC分类号： G01K7/01

摘要： A temperature detector (1) is used to detect a temperature of a circuit under test, and includes a temperature coefficient component (10), a multiplier (12), an impedance component (Zl) and a node (N1). The temperature coefficient component (10) is arranged in proximity to the circuit under test. A control terminal of the multiplier (12) is coupled to the temperature coefficient component (10). The impedance component (Zl) is coupled between the second terminal of the temperature coefficient component (10) and the control terminal of the multiplier (12), or between a second terminal of the multiplier (12) and a third voltage terminal. The node (N1) is formed between the temperature coefficient component (10) and the multiplier (12). An amplified detection current (Ia) flowing to a first terminal of the multiplier (12) is positively correlated to the temperature of the circuit under test.