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公开(公告)号：EP4213397A1
公开(公告)日：2023-07-19
申请号：EP22151519.0
申请日：2022-01-14
发明人： Ruster, Thomas , Renardy, Paul
摘要： The invention relates to a system (100) for filtering a radio frequency, RF, or microwave, MW, signal (101) comprising at least one frequency band. The system comprises at least one gas based quantum sensor (103, 1) which is arranged to receive the RF or MW signal (101), wherein the gas based quantum sensor (103, 1) is configured to measure a spectrum (203) of the RF or MW signal (101) in a determined frequency range; a processing unit (105) which is configured to analyze said spectrum (203) to detect if a signal strength of one or more frequency bands of the RF or MW signal (101) within the frequency range exceed a predefined threshold; and an adjustable filter unit (107) which is arranged to receive and to filter the RF or MW signal (101); wherein the processing unit (105) is configured to adapt a filter function of the adjustable filter unit (107) based on the analysis of the spectrum (203).
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公开(公告)号：EP4215926A1
公开(公告)日：2023-07-26
申请号：EP22152165.1
申请日：2022-01-19
发明人： Ruster, Thomas
IPC分类号： G01R29/08 , G01R33/032
摘要： Disclosed is a measurement system (1) for analyzing an RF signal. The system (1) comprises a sensing medium (11), including at least one constituent being pumpable to an initial energy state, and being excitable from the initial energy state to a higher energy state by exposure to an electric and/or magnetic field. The system (1) further comprises an optical pump (12) configured to pump the at least one constituent of the medium (11) to the initial energy state. The system (1) further comprises an antenna (14) configured to expose the medium (11) to an electromagnetic field of the RF signal. The system (1) further comprises an optical processor (13) configured to displace the pump light transversely along a spatial dimension (X) of the medium (11) in accordance with a displacement cycle. The system (1) further comprises an optical detector (15) configured to continuously detect an optical property of light emanating from the pumped medium (11).
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公开(公告)号：EP4184184A1
公开(公告)日：2023-05-24
申请号：EP21209167.2
申请日：2021-11-19
发明人： Ruster, Thomas
IPC分类号： G01R29/08
摘要： Disclosed is a measurement system (1A, 1B) for analyzing RF signals, comprising an optically transparent enclosure (11) comprising an optically pumpable medium being exposed to an electromagnetic field of the RF signal to be analyzed; an optical pump (12) for penetrating the medium with intensity-modulated light, the intensity defining an absorption sensitivity of the medium; a field generator (13) for generating an electric and/or magnetic field within the enclosure (11), a strength of the generated field defining an absorption frequency ( f RF ) of the medium; a controller (14) for controlling the absorption sensitivity of the medium in dependence of the absorption frequency ( f RF ) of the medium; and a detector (16) for detecting an optical property of the penetrating light passing through the medium. This facilitates fine-tunable and frequency-dependent control of sensitivity and dynamic range for spectral analysis of RF signals.
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4.发明公开
公开(公告)号：EP4174498A1
公开(公告)日：2023-05-03
申请号：EP21204629.6
申请日：2021-10-26
发明人： Ruster, Thomas , BuenoDiez, Miguel
IPC分类号： G01R29/08
摘要： Disclosed is a measurement system (1) for analysing RF signals. The measurement system (1) comprises an optically transparent enclosure (11) comprising an optically pumpable gas, and a printed circuit board, PCB (12A, 12B) comprising an electrical transmission line (121-123) for guiding the RF signal to be analyzed through the enclosure (11) and a reflective planar face. The measurement system (1) further comprises an optical pump (13) for emitting preferably coherent light onto the reflective planar face, and a detector (14) for detecting an optical property of the emitted light being reflected by the reflective planar face. This provides a better laser/microwave overlap in atomic vapor quantum sensing setups, where it is crucial to overlap the regions with highest laser intensity and microwave field strength.
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