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1.发明授权
公开(公告)号：EP3104539B1
公开(公告)日：2017-09-13
申请号：EP15170968.0
申请日：2015-06-08
CPC分类号： H04B17/12 , H04B7/0617 , H04B17/102 , H04B17/21 , H04W24/06 , H04W84/042
摘要： A measuring system (10) for measuring a communication device under comprising an antenna-array test is provided. The measuring system (10) comprises a control unit, a measuring device, at least one measuring antenna (3) and a device under test mount (4). The device under test mount (4) is adapted to hold the device under test and rotate the device under test around at least one axis. The control unit is adapted to set an antenna characteristic of the antenna-array of the device under test, thereby adjusting a set maximum gain direction of the antenna-array. Moreover, the control unit is adapted to instruct the device under test mount (4) to rotate the device under test compensating for the set maximum gain direction of the antenna-array, so that the set maximum gain direction of the antenna-array meets a direction of the measuring antenna (3) regarding the device under tests.
摘要翻译： 提供了一种用于测量包括天线阵列测试的通信设备的测量系统（10）。 测量系统（10）包括控制单元，测量装置，至少一个测量天线（3）和被测试装置（4）。 被测设备安装座（4）适于保持待测设备，并围绕至少一个轴旋转被测设备。 控制单元适用于设置被测设备的天线阵列的天线特性，由此调整天线阵列的设置的最大增益方向。 此外，控制单元适于指示被测设备安装座（4）旋转被测设备以补偿天线阵列的设定的最大增益方向，使得天线阵列的设定的最大增益方向满足 测量天线（3）关于被测设备的方向。
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公开(公告)号：EP3709035A1
公开(公告)日：2020-09-16
申请号：EP19212385.9
申请日：2019-11-29
摘要： A measurement system for real-time visualization of radiation pattern is provided. The measurement system comprises an antenna array with a plurality of antennas configured to provide a voltage gain corresponding to a received radio signal. Furthermore, the measurement system comprises a plurality of radio frequency detectors configured to rectify the voltage gain from each antenna of the plurality of antennas. In addition, the measurement system comprises a plurality of amplifiers downstream of the plurality of radio frequency detectors configured to amplify the magnitude of a rectified voltage from each of the radio frequency detectors. The measurement system moreover comprises a plurality of receiving elements, each includes a light emitting diode and configured to receive an amplified voltage corresponding to each amplifier of the plurality of amplifiers.
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公开(公告)号：EP4142448A1
公开(公告)日：2023-03-01
申请号：EP21193283.5
申请日：2021-08-26
IPC分类号： H05K9/00
摘要： The present disclosure relates to a housing wall comprising at least one air grid having at least a first layer with a first mesh structure and a second layer with a second mesh structure. The first mesh structure is coextensively arranged with the second mesh structure. The first layer and the second layer are electrically conductively coupled. The first mesh structure comprises a first plurality of through-holes. The second mesh structure comprises a second plurality of through-holes. The through-holes of the first plurality of through-holes are misaligned compared to through-holes of the second plurality of through-holes such that a nonuniform total through-hole configuration of the air grid is provided.
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公开(公告)号：EP3926359A1
公开(公告)日：2021-12-22
申请号：EP20180420.0
申请日：2020-06-17
发明人： Steffens, Johannes , Schoch, Andre
IPC分类号： G01S7/40
摘要： A measuring system (1) comprises a radar test panel (10), which is arranged in an expected radiation direction of the vehicular radar (3). The radar test panel (10) comprises a 2D radar test array of radar receivers, and is configured to display a measured beam pattern (12) of the vehicular radar (3), using the radar receivers. Each of the radio receivers is configured to receive radar radiation from the vehicular radar (3) and emit visible light based upon the received radar radiation. Alternatively, the at least one radar test panel is configured to output a digitized measured beam pattern of the vehicular radar.
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5.发明公开MEASURING SYSTEM AND MEASURING METHOD FOR MEASURING DEVICES UNDER TEST WITH ANTENNA-ARRAYS 有权测量系统和测试方法的测量DUT的天线阵列
公开(公告)号：EP3104539A1
公开(公告)日：2016-12-14
申请号：EP15170968.0
申请日：2015-06-08
CPC分类号： H04B17/12 , H04B7/0617 , H04B17/102 , H04B17/21 , H04W24/06 , H04W84/042
摘要： A measuring system (10) for measuring a communication device under comprising an antenna-array test is provided. The measuring system (10) comprises a control unit, a measuring device, at least one measuring antenna (3) and a device under test mount (4). The device under test mount (4) is adapted to hold the device under test and rotate the device under test around at least one axis. The control unit is adapted to set an antenna characteristic of the antenna-array of the device under test, thereby adjusting a set maximum gain direction of the antenna-array. Moreover, the control unit is adapted to instruct the device under test mount (4) to rotate the device under test compensating for the set maximum gain direction of the antenna-array, so that the set maximum gain direction of the antenna-array meets a direction of the measuring antenna (3) regarding the device under tests.
摘要翻译： 的测量系统（10），用于天线阵列测试的包括下测量通信设备被提供。 该测量系统（10）包括一个控制单元，一个测量装置，至少一个测量天线（3）和被测设备支架（4）。 被测设备支架（4）是angepasst保持被测器件与被测围绕旋转装置的至少一个轴。 所述控制单元是angepasst设置到被测装置的天线阵列的天线特性，从而调整天线阵列的一组最大增益方向。 更在控制单元是angepasst指示被测设备支架（4），向被测器件旋转补偿天线阵列的设置的最大增益方向，所以没天线阵列的设置的最大增益方向满足 关于被测设备测量天线（3）的方向。
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公开(公告)号：EP3951405A1
公开(公告)日：2022-02-09
申请号：EP20190129.5
申请日：2020-08-07
摘要： A measurement system (10) for characterizing a device under test (12) is disclosed. The measurement system (10) comprises a signal source (14), an analysis module (16), and a directional element (18) that is connected to each of the device under test (12), the signal source (14), and the analysis module (16). The signal source (14) is configured to generate a digital instruction signal or an analog stimulus signal for the device under test (12). In the case of generating the analog stimulus signal, the directional element (18) is configured to forward the analog stimulus signal from the signal source (14) to the device under test (12), wherein the device under test (12) is configured to generate a digital output signal based on the analog stimulus signal received. In the case of generating the digital instruction signal by means of the signal source (14), the device under test (12) is configured to generate an analog output signal based on the digital instruction signal received, wherein the directional element (18) is configured to forward the analog output signal generated to the analysis module (16). The analysis module (16) is configured to determine at least one characteristic parameter of the device under test (12) based on the analog output signal of the device under test (12) or the digital output signal of the device under test (12). Moreover, a measurement method is disclosed.
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