公开(公告)号：EP4159348A1

公开(公告)日：2023-04-05

申请号：EP22199399.1

申请日：2022-10-03

申请人： Rohr, Inc.

发明人： TAN, Ann Soon Anson ,  ZHOU, Jianhua ,  LIM, Ee Hwee ,  EDWARD, Jeffry

IPC分类号： B23B47/28

摘要： A method (400) includes drilling a first aperture (146) in a panel (22) that extends between a panel first surface (48) and a panel second surface (44). The first aperture (146) projects into the panel (22) along a first centerline (146) from the panel first surface (48). The first centerline (146) is angularly offset from the panel first surface (48) by a first angle (84). A first tool (150) is arranged with the panel (22). The first tool (150) includes a support structure (152), a locator (156) and a drill guide (154). The locator (156) is mounted to the support structure (152) and projects into the first aperture (146). The drill guide (154) is mounted to the support structure (152) and is arranged adjacent the panel second surface (44). A second aperture (220) is drilled in the panel (22) using the drill guide (154). The second aperture (220) projects into the panel (22) along a second centerline (222) from the panel second surface (44) to the first aperture (146). The second centerline (222) is coaxial with the first centerline (148).

公开(公告)号：EP4411366A1

公开(公告)日：2024-08-07

申请号：EP23154284.6

申请日：2023-01-31

申请人： Rohr, Inc.

发明人： LIM, Ee Hwee ,  RAJWANI, Pravin Ishwardas ,  TAN, Anson

IPC分类号： G01N29/04 ,  G01N29/22 ,  G01N29/265 ,  G01N29/28

CPC分类号： G01N29/225 ,  G01N29/265 ,  G01N29/04 ,  G01N29/28

摘要： An apparatus 1 for non-destructive testing of a component 2 is disclosed herein. The apparatus 1 comprises a robotic arm 10, a probe holder 20, a probe 12 connected to the robotic arm 10 via the probe holder 20, and a controller 11 configured to move the robotic arm 10 to move the probe 12 over a surface of a component 2 to be tested. The probe holder 20 comprises a spring assembly 25 for biasing the probe 12 towards the surface of the component 2 to be tested to keep the probe 12 in contact therewith. The spring assembly 25 comprises at least one pair of spring portions 26 that are spaced apart along a first axis, the spring assembly 25 configured such that when the probe 12 is moved over the surface of a component 2 to be tested in a direction parallel to the first axis, the pair of spring portions 26 that are spaced apart along the first axis maintain the probe 12 in a certain orientation relative to the surface of the component 2. A probe holder 20 for holding a probe 12 during non-destructive testing of a component is also disclosed herein.