利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

10 条记录 (耗时 0.01 秒)

    CIRCUIT TESTING CLOSER APPARATUS AND METHOD WITH DYNAMIC TEST THRESHOLDS
    5.
    发明公开
    CIRCUIT TESTING CLOSER APPARATUS AND METHOD WITH DYNAMIC TEST THRESHOLDS 有权
    电路测试闭合装置和具有动态测试阈值的方法

    公开(公告)号：EP2291894A1

    公开(公告)日：2011-03-09

    申请号：EP09751425.1

    申请日：2009-05-20

    申请人： S & C Electric Company

    发明人： MONTENEGRO, Alejandro ,  O'LEARY, Raymond, P.

    IPC分类号： H02H3/06 ,  H01H75/04

    CPC分类号： H02H3/066 ,  H01H33/6662 ,  H01H75/04 ,  H02H3/003 ,  H02H11/00

    摘要： A circuit testing closer is capable of closing a power distribution circuit and interrupting the resulting current at the next current zero. Upon detecting a fault, the circuit testing closer is operable to open contacts to isolate the fault. Next, the circuit testing closer tests the faulted line to determine whether the fault has cleared. The circuit testing closer may employ one or more dynamic thresholds to determine the existence of a fault.

    摘要翻译： 电路测试闭路器能够闭合配电电路并在下一个电流零点处中断所产生的电流。 在检测到故障时，电路测试闭合器可操作以断开触点以隔离故障。 接下来，电路测试闭合器测试故障线路以确定故障是否已清除。 电路测试闭路器可以采用一个或多个动态阈值来确定故障的存在。

    CIRCUIT TESTING CLOSER APPARATUS AND METHOD WITH IN-RUSH CURRENT AWARENESS
    8.
    发明公开
    CIRCUIT TESTING CLOSER APPARATUS AND METHOD WITH IN-RUSH CURRENT AWARENESS 有权
    瑞士麻省理工学院麻省理工学院

    公开(公告)号：EP1949516A1

    公开(公告)日：2008-07-30

    申请号：EP06825346.7

    申请日：2006-10-03

    申请人： S & C Electric Company

    发明人： O'LEARY, Raymond, P. ,  LETTOW, Christopher, R. ,  MONTENEGRO, Alejandro ,  OPFER, John, C.

    IPC分类号： H02H3/06 ,  H02H11/00

    CPC分类号： H02H11/00 ,  H01F7/1607 ,  H01F2007/1692 ,  H01H3/001 ,  H01H33/6662 ,  H01H51/20 ,  H01H75/04 ,  H02H3/066

    摘要： A circuit testing closer is capable of closing a power distribution circuit and interrupting the resulting current at the next current zero. Upon detecting a fault, the circuit testing closer is operable to open contacts to isolate the fault. Next, the circuit testing closer tests the faulted line to determine whether the fault has cleared. The circuit testing closer may generate a first test signal having a first polarity and a second test signal having a second polarity opposite the first polarity. Generation of the second test signal may be limited to occur when the first test signal indicates a fault.

    摘要翻译： 电路测试接近器能够关闭配电电路并且在下一个电流零点中断所得到的电流。 在检测到故障时，电路测试接近器可操作以打开触点以隔离故障。 接下来，电路测试接近器测试故障线路以确定故障是否已经清除。 电路测试接近器可以产生具有第一极性的第一测试信号和具有与第一极性相反的第二极性的第二测试信号。 当第一测试信号指示故障时，可能限制产生第二测试信号。