专利检索 ap:("SAMSUNG ELECTRONICS CO LTD" OR "TDK CORP") AND inv:"ZHAO HUI" 第 1 页

1.

发明公开
WRITING CONDITION OPTIMIZING METHOD AND APPARATUS, AND OPTICAL RECORDING MEDIUM 审中-公开
标题翻译：方法和装置用于书写条款的优化和记录媒体光学

公开(公告)号：EP1964113A4

公开(公告)日：2009-03-25

申请号：EP06835294

申请日：2006-12-20

申请人： SAMSUNG ELECTRONICS CO LTD , TDK CORP

发明人： BAE JAE-CHEOL , KIM JOO-HO , LEE KYUNG-GEUN , ZHAO HUI , FUKUZAWA NARUTOSHI , KIKUKAWA TAKASHI , KOBAYASHI TATSUHIRO

IPC分类号： G11B7/0045 , G11B7/007 , G11B7/125

CPC分类号： G11B7/0062 , G11B7/00736 , G11B7/1267 , G11B20/10055

摘要： A method of optimizing a writing condition of an optical recording medium, including writing test pattern data with the writing condition on the optical recording medium, comparing an error pattern binary signal detected by reproducing the written test pattern data with a correct pattern binary signal of the test pattern data , and determining an optimum writing condition of the optical recording medium based on a result of the comparison.

2.

发明公开
SIGNAL QUALITY MEASURING APPARATUS AND METHOD THEREOF 有权
标题翻译： VERFAHRENDAFÜR的SIGNALQUALITÄTSMESSVORRICHTUNG

公开(公告)号：EP2409448A4

公开(公告)日：2015-06-24

申请号：EP10753668

申请日：2010-03-16

申请人： SAMSUNG ELECTRONICS CO LTD

发明人： PARK HYUN-SOO , LEE KYUNG-GEUN , HWANG IN-OH , ZHAO HUI , SHIN JONG-HYUN

IPC分类号： H04L1/20 , G11B20/10 , H04B17/318

CPC分类号： H04L1/206 , G11B20/10009 , G11B20/10305 , G11B20/10314 , H04B17/318