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公开(公告)号：EP2494339A1
公开(公告)日：2012-09-05
申请号：EP10751799.7
申请日：2010-08-13
申请人： SCHOTT AG
IPC分类号： G01N21/95
CPC分类号： G01N21/9505
摘要： The invention relates to a method and device for detecting cracks in planar semiconductor substrates having two opposite lateral surfaces (30, 31) and a circumferential edge surface, such as silicon wafers and solar cells. The method and device are based on the detection of light refracted at a crack (34), which light is introduced into the edge surface of the semiconductor substrate (3) and exits at the crack location on one of the lateral surfaces.
摘要翻译： 提供了一种用于检测硅晶片和太阳能电池等半导体基板中的裂纹的方法和装置。 该方法和装置基于在裂纹处偏转的光的检测。
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2.发明公开VERFAHREN ZUR HERSTELLUNG VON LINIENFÖRMIG AUFGEREIHTEN SCHÄDIGUNGSSTELLEN DURCH ULTRAKURZ FOKUSSIERTER GEPULSTER LASERSTRHALUNG ; VERFAHREN UND VORRICHTUNG ZUM TRENNEN EINES WERKSTÜCKES MITTEL ULTRAKURZ FOKUSSIERTER LASERSTRAHLUNG UNTER VERWENDUNG EINER SCHUTZGASATMOSPHÄRE 有权用于生产SET采用超短线类系列伤害聚焦脉冲激光辐射; 方法和设备切割工件使用超短聚焦的激光辐射使用保护气体氛围
公开(公告)号：EP2931467A2
公开(公告)日：2015-10-21
申请号：EP13792624.2
申请日：2013-11-08
申请人： Schott AG
CPC分类号： C03B33/0222 , B23K26/0057 , B23K26/0624 , B23K26/08 , B23K26/083 , B23K26/123 , B23K26/127 , B23K26/14 , B23K26/364 , B23K26/38 , B23K26/40 , B23K26/402 , B23K2201/18 , B23K2203/50 , B23K2203/52 , B23K2203/54 , B28D5/0011
摘要： The invention relates to a method for preparing the separation of transparent workpieces (2). Aligned filament structures (4, 5, 6) extending transversely through the workpiece are generated along a pre-determined breaking line (20) by means of ultra-short laser pulses. The workpiece is separated in a subsequent step.
摘要翻译： 提供了一种制备透明的工件进行分离的方法。 该方法包括生成对准的长丝通过地层沿着在使用超短激光脉冲预期断裂线工件横向延伸。
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3.发明公开VERFAHREN ZUR THERMOGRAPHISCHEN PRÜFUNG NICHTMETALLISCHER WERKSTOFFE, INSBESONDERE BESCHICHTETER NICHTMETALLISCHER WERKSTOFFE, SOWIE VERFAHREN ZU DEREN HERSTELLUNG UND VERFAHRENSGEMÄSS HERGESTELLTER KÖRPER 审中-公开METHODS FOR热敏打印测试非金属材料，尤其是涂料的非金属材料，AND METHOD FOR THE PRODUCTION和转诊MADE BODY
公开(公告)号：EP2263076A1
公开(公告)日：2010-12-22
申请号：EP09725446.0
申请日：2009-03-28
申请人： Schott AG
IPC分类号： G01N25/72
CPC分类号： G01N25/72
摘要： The invention relates to a method for thermographic inspection of non-metallic materials, in particular coated non-metallic materials, in which at least part of the surface of the non-metallic material, preferably part of the surface provided with a non-metallic coating, is heated, in particular by using a short energy pulse, preferably a light pulse, or by periodic heat influx, and the temporal and spatial temperature profile can be recorded at at least a number of subsequent times; it also relates to a production method which utilizes the above and objects produced according to the production method.
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4.发明授权
公开(公告)号：EP1390782B1
公开(公告)日：2005-06-08
申请号：EP02740419.3
申请日：2002-03-08
申请人： SCHOTT AG
发明人： ANTON, Andrea , KÄLBER, Tobias , WOLFF, Detlef , LOHMEYER, Manfred , BRINKMANN, Matthias , GERSTNER, Klaus
CPC分类号： G02B6/12014 , G02B6/12021 , G02B6/2808
摘要： The invention relates to a AWG-coupler for the spectral separation of electromagnetic rays. According to the invention, a coupler with more stabile thermal behaviour in addition to having a smaller layout is obtained and is provided with a single free ray area for the injection and extraction of electromagnetic rays.
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5.发明授权VERFAHREN ZUR HERSTELLUNG VON LINIENFÖRMIG AUFGEREIHTEN SCHÄDIGUNGSSTELLEN DURCH ULTRAKURZ FOKUSSIERTER GEPULSTER LASERSTRAHLUNG ; VERFAHREN UND VORRICHTUNG ZUM TRENNEN EINES WERKSTÜCKES MITTELS ULTRAKURZ FOKUSSIERTER LASERSTRAHLUNG UNTER VERWENDUNG EINER SCHUTZGASATMOSPHÄRE 有权用于通过超短焦脉冲激光辐射制造线损伤害的方法; 通过使用保护性加速器的超短焦激光辐射来隔离工件的方法和装置
公开(公告)号：EP2931467B1
公开(公告)日：2017-06-14
申请号：EP13792624.2
申请日：2013-11-08
申请人： Schott AG
CPC分类号： C03B33/0222 , B23K26/0057 , B23K26/0624 , B23K26/08 , B23K26/083 , B23K26/123 , B23K26/127 , B23K26/14 , B23K26/364 , B23K26/38 , B23K26/40 , B23K26/402 , B23K2201/18 , B23K2203/50 , B23K2203/52 , B23K2203/54 , B28D5/0011
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6.发明授权EINRICHTUNG ZUR ÜBERTRAGUNG OPTISCHER SIGNALE MIT VERBESSERTEN ÜBERTRAGUNGSEIGENSCHAFTEN 有权装置上使用改进的传输结构的光学传输信号
公开(公告)号：EP1334389B1
公开(公告)日：2005-03-09
申请号：EP01992906.6
申请日：2001-11-01
申请人： SCHOTT AG
发明人： PAWLOWSKI, Edgar , GERSTNER, Klaus , SCHLATTERBECK, Dirk , PEUCHERT, Ulrich , SPRENGARD, Rüdiger , KÄLBER, Tobias , BRINKMANN, Matthias , WALTHER, Marten
IPC分类号： G02B6/293
CPC分类号： G02B6/12011 , G02B6/12019 , G02B6/12033
摘要： According to the invention, the signal quality on passing through a device for the transmission of optical signals, comprising a waveguide with a doped region, containing a material suitable for the amplification of optical signals may be impaired as little as possible, whereby the doped region has a pre-defined absorption and may have the amplification thereof altered by the injection of pumping light.
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7.发明授权VERFAHREN UND VORRICHTUNG ZUR DETEKTION VON RISSEN IN HALBLEITERSUBSTRATEN 有权VERFAHREN UND VORRICHTUNG ZUR在福尔里瑟特森遇到冯·里森
公开(公告)号：EP2494339B1
公开(公告)日：2017-07-19
申请号：EP10751799.7
申请日：2010-08-13
申请人： SCHOTT AG
IPC分类号： G01N21/95
CPC分类号： G01N21/9505
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公开(公告)号：EP1409422B1
公开(公告)日：2013-04-17
申请号：EP01995121.9
申请日：2001-11-16
申请人： Schott AG
发明人： GERSTNER, Klaus , PLICHTA, Armin , SCHLATTERBECK, Dirk , WEISSER, Michael , BRIX, Peter , SOMMER, Martin , RUBINO, Jr., Robert, A. , BONJA, Jeffrey, A. , STRACK, Richard , HENZE, Inka , ARSENAULT, Paul
IPC分类号： C03B37/028 , C03B37/023 , C03B40/033 , C03B37/15 , G02B6/06
CPC分类号： G02B6/06 , A61B1/00165 , C03B37/028 , C03C25/66 , C03C2218/355 , G02B6/04 , Y02P40/57
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9.发明授权
公开(公告)号：EP2044387B1
公开(公告)日：2012-10-24
申请号：EP07786234.0
申请日：2007-07-20
申请人： Schott AG
发明人： ORTNER, Andreas , GERSTNER, Klaus , JUNG, Sascha
CPC分类号： G01B11/0691
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10.发明公开
公开(公告)号：EP2044387A1
公开(公告)日：2009-04-08
申请号：EP07786234.0
申请日：2007-07-20
申请人： Schott AG
发明人： ORTNER, Andreas , GERSTNER, Klaus , JUNG, Sascha
CPC分类号： G01B11/0691
摘要： In order to facilitate robust and accurate inline measurement of thickness profiles of transparent substrates, a system for the thickness measurement of transparent flat substrates is provided, comprising at least two measuring heads and a traversing device with two traversing units to which the measuring heads are attached and which are movable, independent of one another, over the substrate at an angle to a feed direction of the glass sheet. Said system also comprises a control device which controls the movement of the traversing units in such a way that, in operation, the traversing units are moved from edge to edge, offset in phase and at an angle to the feeding direction of the substrate, and also an analysis device which determines thickness profiles, with the aid of the data from the measuring heads.
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