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公开(公告)号:EP3708631A1
公开(公告)日:2020-09-16
申请号:EP20167117.9
申请日:2010-03-12
发明人: WANG, Jun , LACONTO, Ronald , HAERLE, Andrew
摘要: A method for chemical mechanical polishing of a substrate includes polishing the substrate at a stock removal rate of greater than about 2.5 Å/min to achieve a Ra of not greater than about 5.0 Å. The substrate can be a III-V substrate or a SiC substrate. The polishing utilizes a chemical mechanical polishing slurry comprising ultra-dispersed diamonds and at least 80 wt% water.
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公开(公告)号:EP2406341A2
公开(公告)日:2012-01-18
申请号:EP10751523.1
申请日:2010-03-12
发明人: WANG, Jun , LACONTO, Ronald , HAERLE, Andrew
IPC分类号: C09K3/14
CPC分类号: H01L21/30625 , B24B37/00 , C09G1/02 , C09K3/1409 , C09K3/1463 , H01L21/02024 , H01L29/1608
摘要: A method for chemical mechanical polishing of a substrate includes polishing the substrate at a stock removal rate of greater than about 2.5 Å/min to achieve a Ra of not greater than about 5.0 Å. The substrate can be a III-V substrate or a SiC substrate. The polishing utilizes a chemical mechanical polishing slurry comprising ultra-dispersed diamonds and at least 80 wt% water.
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公开(公告)号:EP2260013A2
公开(公告)日:2010-12-15
申请号:EP09710429.3
申请日:2009-02-05
发明人: HAERLE, Andrew, G. , WANG, Jun
CPC分类号: C01F17/0043 , B82Y30/00 , C01P2004/03 , C01P2004/50 , C01P2004/54 , C01P2004/64 , C01P2006/10 , C01P2006/12 , C09K3/1409 , C09K3/1463
摘要: A particulate material comprising cerium oxide particles having a secondary particle size distribution in a range of 80 nm to 199 nm and a density of at least 6.6 g/cm3.
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