公开(公告)号：EP3315942A1

公开(公告)日：2018-05-02

申请号：EP17193182.7

申请日：2017-09-26

Applicant: Samsung Electronics Co., Ltd.

Inventor： YEO, Yeong Bae ,  PARK, Sil ,  BAE, Su Bong

IPC: G01N21/07 ,  G01N21/59 ,  B01L3/00 ,  G01N21/75 ,  G01N35/00 ,  G01N21/84 ,  G01N21/17

CPC classification number: G01N33/49 ,  B01L3/502715 ,  G01N21/0303 ,  G01N21/07 ,  G01N21/59 ,  G01N21/75 ,  G01N33/50 ,  G01N35/00069 ,  G01N35/00722 ,  G01N35/00732 ,  G01N2021/0325 ,  G01N2021/178 ,  G01N2021/8488 ,  G01N2035/00891 ,  G01N2201/0633 ,  G01N2201/064 ,  G01N2201/0642

Abstract: A test device (100), test system, and control method of the test device (100), which defines a light irradiating area in a reactor (20) to prevent a decrease in magnitude of a detected signal that may result due to scattering of light that has penetrated other area of the reactor (20) than an area (25) containing an object for detection and improve a dynamic range. A test device (100) may include a light source (130) configured to irradiate light; a reactor (20) configured to include at least one first area (25) to contain an object for detection; and a photo detector (150) configured to receive light that has been irradiated from the light source (130) and has passed the reactor (20) that contains the object for detection, wherein the light source (130) is configured to limitedly irradiate the light to the first area (25) of the reactor (20).

Abstract translation: 测试装置（100）的测试装置（100），测试系统和控制方法限定反应器（20）中的光照射区域以防止可能由于散射导致的检测信号的幅度的减小 已经穿过反应器（20）的其他区域的光而不是包含用于检测的对象的区域（25）并且改善动态范围。 测试装置（100）可以包括被配置为照射光的光源（130） 反应器（20），配置为包括至少一个第一区域（25）以容纳用于检测的物体; 和光检测器（150），被配置为接收已经从所述光源（130）照射并且已经经过包含所述检测对象的所述反应器（20）的光，其中所述光源（130）被配置为有限地照射 光照射到反应器（20）的第一区域（25）。