公开(公告)号：EP2864814A1

公开(公告)日：2015-04-29

申请号：EP13739178.5

申请日：2013-07-09

Applicant: Siemens Aktiengesellschaft

Inventor： KRAFT, Edgar ,  NIEDERLÖHNER, Daniel ,  STRASSBURG, Matthias ,  WIRTH, Stefan ,  HACKENSCHMIED, Peter ,  KAPPLER, Steffen ,  KREISLER, Björn ,  LABAYEN DE INZA, Miguel ,  REINWAND, Mario ,  SCHRÖTER, Christian

IPC: G01T1/24

CPC classification number: G01T1/244 ,  G01N23/04 ,  G01N23/046 ,  G01T1/026 ,  G01T1/24

Abstract: The invention relates to a method for detecting x-rays (R) using an x-ray detector (100) which has a direct-conversion semiconductor detector element (150a, 150b). Additional radiation (K) is supplied to the semiconductor detector element (150a, 150b) using a radiation source (210a, 210b), and the supply of the additional radiation (K) is controlled and/or regulated on the basis of a specified target value (T
a , T
b , T
c ). In particular, the target value can be specified in a variable manner over time as a sequence of target values. The invention further relates to an x-ray detector system (200) with which the method can be carried out.

Abstract translation: 公开了一种使用包括直接转换半导体检测器元件的x射线检测器来检测X射线的方法。 使用辐射源将附加辐射提供给半导体检测器元件，并且基于指定的目标值来控制和/或调节附加辐射的供应。 在至少一个实施例中，目标值可以随时间变化地指定为目标值序列。 进一步公开了一种可以进行该方法的X射线检测器系统。