Patent search ap:("TOKYO SEIMITSU CO LTD") AND inv:"ISHIKAWA YASUNARI" Page 1

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发明公开
SURFACE SHAPE MEASURING DEVICE, AND SURFACE SHAPE MEASURING METHOD 有权
Title translation: 用于测量形式和方法的表面测量表面FORM

公开(公告)号：EP2037211A4

公开(公告)日：2016-06-29

申请号：EP08764773

申请日：2008-05-21

Applicant: TOKYO SEIMITSU CO LTD

Inventor： ISHIKAWA YASUNARI

IPC: G01B5/28 , G01B5/20

CPC classification number: G01B5/20 , G01B5/28

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