专利检索 ap:("Technische Universiteit Delft") AND inv:"XU, Qiang" 第 1 页

1.

发明公开
METHOD FOR REMOVING A HIGH DEFINITION NANOSTRUCTURE, A PARTLY FREESTANDING LAYER, A SENSOR COMPRISING SAID LAYER AND A METHOD USING SAID SENSOR 审中-公开
标题翻译：脱除高分辨率纳米结构的方法，部分分离层传感器，所述层和使用方法此类传感器

公开(公告)号：EP2823358A1

公开(公告)日：2015-01-14

申请号：EP13710624.1

申请日：2013-03-04

申请人： Technische Universiteit Delft

发明人： XU, Qiang , SCHNEIDER, Grégory , ZANDBERGEN, Henny , WU, Mengyue , SONG, Bo , DE HEER, Cornelius Dekker

IPC分类号： G03F7/00 , G03F7/20 , G01N33/487 , H01L29/16

CPC分类号： G01N33/48721 , B81C1/00492 , B81C1/00531 , B81C2201/0143 , B81C2203/00 , B82Y30/00 , B82Y40/00 , G03F7/00 , G03F7/2037 , G03F7/2059 , Y10T428/24355

摘要： The present invention is in the field of a method for removing a high definition nanostructure in a partly free-standing layer, the layer, a sensor comprising said layer, a use of said sensor, and a method of detecting a species, and optional further characteristics thereof, using said sensor. The sensor and method are suited for detecting single ions, molecules, low concentrations thereof, and identifying sequences of base pairs, e.g. in a DNA-strand.