公开(公告)号：EP2253965A3

公开(公告)日：2010-12-15

申请号：EP10250927.0

申请日：2010-05-14

Applicant: Tektronix, Inc.

Inventor： Grn, Prasanth ,  Pongched, Pechluck ,  Raghavendran, N. ,  Guenther, Mark L. ,  Sri, Krishna N.H. ,  Ajgaonkar, Manisha

IPC: G01R31/317 ,  G11C29/50

CPC classification number: G01R31/317 ,  G01R13/02

Abstract: Embodiments of the invention provide a system and method to measure and represent the measured value of a limit in terms of another measurement, such as clock values or cycles of the system. The system can include, for example, a test and measurement instrument such as an oscilloscope. In another embodiment of the present invention, slew rate de-rated values may be automatically determined through the use of configurable lookup tables.

公开(公告)号：EP2253965B1

公开(公告)日：2015-07-08

申请号：EP10250927.0

申请日：2010-05-14

Applicant: Tektronix, Inc.

Inventor： Grn, Prasanth ,  Pongched, Pechluck ,  Raghavendran, N. ,  Guenther, Mark L. ,  Sri, Krishna N.H. ,  Ajgaonkar, Manisha

IPC: G01R13/02 ,  G01R31/317

CPC classification number: G01R31/317 ,  G01R13/02

公开(公告)号：EP2253965A2

公开(公告)日：2010-11-24

申请号：EP10250927.0

申请日：2010-05-14

Applicant: Tektronix, Inc.

Inventor： Grn, Prasanth ,  Pongched, Pechluck ,  Raghavendran, N. ,  Guenther, Mark L. ,  Sri, Krishna N.H. ,  Ajgaonkar, Manisha

IPC: G01R31/317

CPC classification number: G01R31/317 ,  G01R13/02

Abstract: Embodiments of the invention provide a system and method to measure and represent the measured value of a limit in terms of another measurement, such as clock values or cycles of the system. The system can include, for example, a test and measurement instrument such as an oscilloscope. In another embodiment of the present invention, slew rate de-rated values may be automatically determined through the use of configurable lookup tables.

Abstract translation: 本发明实施例提供一种系统和方法来测量和表示在另一个测定中，颜色方面的极限的测量值：诸如系统的时钟值或周期的系统可以包括，例如，测试和测量仪器：如 在示波器上。 在本发明另一实施例，转换率降额值可以是自动确定的，通过使用可配置的查找表的开采。