公开(公告)号：EP3391065A1

公开(公告)日：2018-10-24

申请号：EP16828960.1

申请日：2016-12-16

申请人： Teraview Limited

发明人： COLE, Bryan Edward ,  SULLIVAN, Darius ,  CHANDLER, Simon

IPC分类号： G01R31/28 ,  G01R31/308

CPC分类号： G01R31/2887 ,  G01R31/308 ,  G01R35/005

摘要： A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.