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公开(公告)号:EP1933365A1
公开(公告)日:2008-06-18
申请号:EP06405519.7
申请日:2006-12-14
申请人: Tofwerk AG
CPC分类号: H01J49/4215 , H01J49/40
摘要: An apparatus for mass analysis of ions comprises a high current ion source (10), in particular an ion source providing at least 5 million ions/s, preferably at least 50 million ions/s, at an output of the ion source, a time-of-flight mass spectrometer (40) for analysis of ions transmitted from the ion source (10) and a mass filter (20) for segmenting incoming ions according to their m/q ratio into a first group of ions and into a second group of ions. The mass filter (20) is coupled to the ion source (10) and the mass filter (20) and the time-of-flight mass spectrometer are arranged in such a way that the ions of the first group are transmitted to the mass spectrometer (40) and that the ions of the second group are not transmitted to the mass spectrometer (40). Furthermore, the mass filter (20) is designed in such a way that the second group consists of ions belonging to one or several narrow bands of m/q. The apparatus allows for analyzing minor compound ions generated by the high current ion source (10) with good selectivity, undisturbed by major compounds.
摘要翻译: 用于离子质量分析的装置包括高电流离子源(10),特别是在离子源的输出处提供至少500万个离子/秒,优选至少5000万个离子/ s的离子源,时间 用于分析从离子源(10)传输的离子的质子过滤质谱仪(40)和用于将进入的离子根据其m / q比分割成第一组离子的质量过滤器(20),并进入第二组 的离子。 质量过滤器(20)耦合到离子源(10)并且质量过滤器(20)和飞行时间质谱仪被布置成使得第一组的离子被传输到质谱仪 (40),并且第二组的离子不被传递到质谱仪(40)。 此外,质量过滤器(20)被设计成使得第二组由属于m / q的一个或几个窄带的离子组成。 该装置允许以高选择性分析由高电流离子源(10)产生的次要复合离子,而不受主要化合物干扰。